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Grouped microscopic reconstruction method for Fourier Ptychography

A technology of Fourier stacking and Fourier spectrum, which is applied in the field of high-resolution microscopic reconstruction of grouped Fourier stacking, can solve the problems such as the degradation of reconstruction quality, achieve high-resolution reconstruction, and realize high-resolution reconstruction. Effect

Inactive Publication Date: 2019-09-27
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

Although this method can improve the reconstruction speed to a certain extent, the removal of the original image containing effective information will cause the degradation of the reconstruction quality.

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  • Grouped microscopic reconstruction method for Fourier Ptychography
  • Grouped microscopic reconstruction method for Fourier Ptychography
  • Grouped microscopic reconstruction method for Fourier Ptychography

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Embodiment Construction

[0030] In order to better illustrate the purpose and advantages of the present invention, the present invention will be further described below in conjunction with the accompanying drawings and examples.

[0031] Fourier stacking technology models the sample imaging process under obliquely incident quasi-monochromatic light illumination, and thus develops a method for recovering the high-resolution complex amplitude of the sample by using multiple intensity images for inverse reconstruction. The grouped Fourier stack reconstruction algorithm is based on the development and improvement of the existing Fourier stack imaging principle, and the grouped Fourier stack reconstruction method of the present invention is based on the existing Fourier stack imaging The basic process of imaging and reconstruction in the technique.

[0032] Among them, the imaging process of the existing Fourier stack imaging technology is as follows:

[0033] In Fourier stack imaging, for a thin sample, ...

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Abstract

The invention provides a grouped microscopic reconstruction method for Fourier Ptychography; the defect of a lack of speed in the traditional reconstruction method for Fourier Ptychography can be overcome, and the improvement of the reconstruction speed for Fourier Ptychography on the order of magnitude can be realized. According to the grouped microscopic reconstruction method for Fourier Ptychography in the invention, coarse-to-fine grouped Fourier Ptychography is used for reconstruction, a graph processor is used for performing parallel processing on reconstruction operation, the defect of a lack of speed in the traditional reconstruction method for Fourier Ptychography is overcome, and the improvement of the reconstruction speed for Fourier Ptychography on the order of magnitude is achieved; moreover, the grouped microscopic reconstruction method for Fourier Ptychography can be easily combined with the existing reconstruction method for Fourier Ptychography without adding too much hardware resources or special operation steps.

Description

technical field [0001] The invention belongs to the technical field of computational imaging, and in particular relates to a grouped Fourier stack high-resolution microscopic reconstruction method, the object of which is to realize fast reconstruction of Fourier stack high-resolution microscopic images. Background technique [0002] High resolution and wide field of view have always been the goals pursued by optical microscopy technology. However, due to the limitations that the optical system itself cannot break through, high resolution and wide field of view cannot be combined. This problem greatly limits optical microscopy. The application of technology in many fields. Fourier laminated microscopic imaging (FPM) is a new computational imaging technology developed this year. By introducing phase recovery and synthetic aperture technology, it realizes high-resolution reconstruction of wide-field images. Fourier stack microscopic imaging technology has received a lot of res...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/36
CPCG02B21/361G02B21/365G02B21/367
Inventor 许廷发张继洲张一舟陈思凝王杏
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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