Method and device for automatically identifying position of test patterns in chart picture

A test pattern and automatic recognition technology, applied in the optical field, can solve the problems of low work efficiency and cumbersome process of manually obtaining the position of the test pattern, so as to avoid the difference error and reduce the position of the test pattern.

Active Publication Date: 2019-09-27
深圳市同为数码科技股份有限公司
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Problems solved by technology

However, the process of manually obtaining the position of the test pattern is cumbersome and the work efficiency is extremely low

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  • Method and device for automatically identifying position of test patterns in chart picture
  • Method and device for automatically identifying position of test patterns in chart picture
  • Method and device for automatically identifying position of test patterns in chart picture

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[0061] In order to fully understand the technical content of the present invention, the technical solutions of the present invention will be further introduced and illustrated below in conjunction with specific examples, but not limited thereto.

[0062] It should be understood that in this document, relational terms such as first and second etc. are only used to distinguish one entity / operation / object from another entity / operation / object and do not necessarily require or imply that these entities / operations / objects There is no such actual relationship or order between operations / objects.

[0063]It should also be understood that the term "comprises," "comprises," or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or system that includes a set of elements includes not only those elements, but also includes the elements not expressly included. other elements listed, or also include elements inherent in such a proc...

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Abstract

The invention discloses a method and a device for automatically identifying positions of test patterns in a chart picture. The method comprises the following steps of: performing rectangular frame calibration on all the test patterns in the chart picture; placing the chart picture in a camera obscura, and shooting the chart picture through a camera; collecting an image shot by a camera; carrying out Gaussian smoothing processing on the image; performing edge extraction on all the test patterns in the smoothed image to obtain graphic contours of all the test patterns; carrying out polygon fitting on all the graphic contours to obtain a plurality of polygons; judging whether the polygon is a pre-calibrated rectangular frame or not; and if yes, eliminating the rectangular frame. According to the invention, the position of the test pattern can be automatically identified, the tedious processes of manually marking the position of the test pattern and the like caused by inconsistent position of the test pattern due to difference of the position of the chart and camera parameters are reduced, and the problem of difference errors caused by manual acquisition of the position of the test pattern is avoided.

Description

technical field [0001] The invention relates to the field of optics, in particular to a method and device for automatically identifying the position of a test pattern in a chart image. Background technique [0002] Image resolution determination is an important branch of technology in the field of optics, and it is of great significance in the production and application of cameras. At present, in the process of judging the resolution of an image, it is necessary to manually obtain the position of the test pattern, and then sample the test pattern from the chart picture at each position, and then use the TV-line algorithm to judge the resolution. However, the process of manually obtaining the position of the test pattern is cumbersome and the work efficiency is extremely low. Therefore, there is an urgent need for a method that can automatically identify the position of the test pattern. Contents of the invention [0003] The purpose of the present invention is to overcom...

Claims

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Application Information

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IPC IPC(8): G06T7/73G06T7/13G06T7/80
CPCG06T2207/10004G06T2207/30204G06T7/13G06T7/73G06T7/80
Inventor 陈科傅勇谋
Owner 深圳市同为数码科技股份有限公司
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