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Fan testing method

A fan test and fan technology, applied in non-variable-capacity pumps, pump control, machines/engines, etc., can solve the problems of time-consuming and labor costs, fan damage, inaccurate adjustment results, etc., to reduce errors and increase efficiency and precision effects

Active Publication Date: 2019-10-11
MITAC COMP (SHUN DE) LTD +1
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  • Abstract
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Problems solved by technology

[0003] However, traditional testing methods are often unable to accurately adjust the voltage, which can easily cause damage to the fan, and it is difficult to judge the relative relationship between the fan speed and temperature in real time, resulting in inaccurate final adjustment results.
On the other hand, the past testing operations could not be scheduled efficiently, consuming considerable time and labor costs

Method used

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Embodiment Construction

[0015] see figure 1 As shown, the present invention provides a fan testing method, and the testing fixture 100 includes a testing host 102 and a micro-processing unit 104 . The test host 102 can be a host computer, a notebook computer, etc., which can provide a user interface for test control and inspection of electronic devices, and the micro-processing unit 104 can include at least one of MCU8051, FPGA, etc., for transmitting data according to the test host 102 According to the test parameters (for example, fan speed, frequency, duty cycle, etc.) to generate a pulse width modulation signal (PWM) to drive the corresponding fan. In some embodiments, the test host 102 is connected to the micro-processing unit 104 via a USB interface.

[0016] In this embodiment, the mainboard 200 can be a mainboard for a computer device or a server, or a fan substrate for setting a cooling module, etc. The mainboard 200 includes fans FAN1, FAN2, and FAN3, and the fans FAN1, FAN2, and FAN3 are...

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Abstract

The invention provides a fan testing method which is suitable for testing a mainboard provided with a plurality of fans. The method comprises the following steps: differentiating the fans into fault testing fans and normal operating fans; driving the fault testing fans in a fault working period in a preset fault state; driving the normal operating fans in a preset normal working period in a presetnormal state; in the testing period, recording the temperature value of the mainboard and the rotating speed values of the fans; and generating a testing result according to the temperature value recorded in the testing period and the rotating speed values of the fans.

Description

technical field [0001] The invention relates to a fan testing method, in particular to a fan testing method for testing a fan in a fault state. Background technique [0002] Fans are installed on the motherboards of current computer devices or server devices to dissipate heat from the electronic components on the motherboards to avoid damage. Depending on the operating status, the fan speed may also be different. In order to optimize the heat dissipation efficiency of the fan, generally speaking, R&D testers will simulate various fan states, control the fan speed by repeatedly adjusting the voltage, and measure the actual fan speed and temperature changes to judge the current forecast of the fan. Whether the working cycle, speed and its control mechanism need to be adjusted. [0003] However, traditional testing methods are often unable to accurately adjust the voltage, which may easily cause damage to the fan, and it is difficult to judge the relative relationship between...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): F04D27/00
CPCF04D27/001
Inventor 陈浩彬温增兴
Owner MITAC COMP (SHUN DE) LTD
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