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Automatic chip test system

A technology of chip testing and testing equipment, which is applied in the direction of electronic circuit testing, measuring electronics, measuring equipment, etc., can solve the problems of confusion between good and bad products, low accuracy, high testing cost, etc., and achieve the goal of improving testing efficiency and testing accuracy Effect

Inactive Publication Date: 2019-10-11
北京君正集成电路股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] This test method is not only inefficient, but also may misplace the chip when manually placing the chip, causing confusion between good and bad products, and the test cost is high
[0004] Aiming at the problems of low efficiency and low accuracy in the existing way of manually testing chips, no effective solution has been proposed yet

Method used

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  • Automatic chip test system
  • Automatic chip test system
  • Automatic chip test system

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Embodiment Construction

[0022] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with the embodiments and accompanying drawings. Here, the exemplary embodiments and descriptions of the present invention are used to explain the present invention, but not to limit the present invention.

[0023] Considering the technical problems of low testing efficiency and low accuracy in existing chip testing methods, an automated chip testing system is provided in this example, which improves testing efficiency and accuracy of test results through automated chip testing. like figure 1 As shown, the automated chip testing system may include: a grabbing device 101, a testing device 102, and a controller 103, wherein:

[0024] A tested chip is placed on the test device 102 for testing the tested chip 10;

[0025] The grabbing device 101 is used to place the chip under test at the target posi...

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Abstract

The invention provides an automatic chip test system. The system comprises a grab device, a test device and a controller, wherein a tested chip is placed on the test device, and the test device is used for testing the tested chip; the grab device is used for placing the tested chip to a target position according to test result information after testing of the tested chip is completed; and the controller is connected with the grab device and the test device and is used for controlling the grab device and the test device. Through the scheme, the technical problems that through an existing chip test mode, test efficiency is low, and test result accuracy is low are solved, and the technical effect of effectively improving test efficiency and test accuracy is achieved.

Description

technical field [0001] The invention relates to the technical field of equipment control, in particular to an automatic chip testing system. Background technique [0002] After the chip is packaged, it is generally tested to separate good and bad products. Existing chip testing methods generally adopt manual testing. Generally, 2 to 3 test benches are set up in front of each tester, and the test is performed by manually viewing the indicator light information of the test bench (for example: the green indicator light represents good products, and the red light represents defective products) to determine the chip under test. Is it a good product. [0003] This test method is not only inefficient, but also may misplace the chip when manually picking and placing the chip, causing confusion between good and bad products, and the test cost is high. [0004] Aiming at the problems of low efficiency and low accuracy in the existing manual testing method of chips, no effective sol...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 洪涛
Owner 北京君正集成电路股份有限公司