Electronic product quality automatic detection method based on knowledge graph

A quality inspection method and technology for electronic products, applied in the direction of unstructured text data retrieval, resources, instruments, etc., can solve the problems of excessive manual participation, less data correlation in the inspection unit, and high technical level requirements of inspectors, and achieve the goal of improving The effect of recognition efficiency

Active Publication Date: 2019-10-22
CHONGQING UNIV OF POSTS & TELECOMM
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Problems solved by technology

[0004] In view of this, the purpose of the present invention is to provide an automatic quality detection method for electronic products based on knowledge graphs to solve the problem of excessive manual parti

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  • Electronic product quality automatic detection method based on knowledge graph
  • Electronic product quality automatic detection method based on knowledge graph
  • Electronic product quality automatic detection method based on knowledge graph

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Embodiment Construction

[0072] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention. It should be noted that the diagrams provided in the following embodiments are only schematically illustrating the basic concept of the present invention, and the following embodiments and the features in the embodiments can be combined with each other in the case of no conflict.

[0073] Wherein, the accompanying drawings are for illustrative purposes only, and represent only schematic diagrams, rather than physical drawings, and should...

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Abstract

The invention relates to an electronic product quality automatic detection method based on a knowledge graph, and belongs to the field of electronic product quality detection and knowledge graphs. Themethod comprises the steps of constructing a domain knowledge graph and realizing a quality detection method; constructing a product domain knowledge graph through related standard literature and technical specification of the electronic product. The electronic product quality detection process is detected from four aspects. The process comprises the steps of adopting an ontology modeling methodto manage a mode layer of the knowledge graph; constructing a data layer on the basis of the mode layer; extracting entities and entity relationships from a plurality of heterogeneous data sources byadopting a Bi-LSTM + Attention + CRF method. The data fusion generally adopts a similarity calculation method. A data layer stores knowledge in a Neo4j graph database by taking facts as units. The product quality detection is carried out by utilizing a product standard domain knowledge graph, and a front-end module is added and is used for directly querying quality detection data.

Description

technical field [0001] The invention belongs to the fields of electronic product quality detection and knowledge map, and relates to an electronic product quality automatic detection method based on knowledge map. Background technique [0002] Electronic products have now become an indispensable part of people's lives. The quality of electronic products is the primary requirement for people to choose. Most of the quality inspections of electronic products use manual inspection methods. Self-inspection, mutual inspection and initial inspection are carried out in product production. Manual inspection will prolong the development cycle, reduce the efficiency of development, and cause many disadvantages. In addition, a large amount of data will be generated during the detection process, but each detection system is independent of each other, which will cause a large amount of data redundancy and inconsistent data structure, and cannot establish the relationship between data know...

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Application Information

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IPC IPC(8): G06F16/33G06F16/35G06F16/36G06Q10/06
CPCG06F16/3331G06F16/35G06F16/367G06Q10/06395Y02P90/30
Inventor 李勇李容王平
Owner CHONGQING UNIV OF POSTS & TELECOMM
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