Sorting machine for electronic component testing

A technology for electronic components and sorting machines, applied in sorting, measuring electricity, measuring devices, etc., can solve problems such as incorrect, unconsidered vibration, and electronic component damage test results, so as to prevent damage and improve reliability Effect

A technology for electronic components and sorting machines, applied in sorting, measuring electricity, measuring devices, etc., can solve problems such as incorrect, unconsidered vibration, and electronic component damage test results, so as to prevent damage and improve reliability Effect

CN110394315BActive Publication Date: 2021-12-24TECHWING CO LTD
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  • Sorting machine for electronic component testing
  • Sorting machine for electronic component testing
  • Sorting machine for electronic component testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] Preferred embodiments according to the present invention will be described with reference to the accompanying drawings. Here, for the sake of brevity of description, descriptions on repeated or substantially identical configurations are omitted or compressed as much as possible.

[0045]

[0046] figure 1 It is a schematic plan view of a sorter (100, hereinafter abbreviated as 'sorter') for electronic component testing according to the most preferred embodiment of the application of the present invention.

[0047] like figure 1 As shown, the sorting machine according to the present invention includes: three loading stackers LS, two loading plates 110, four unloading plates 120, four loading platforms 130, four movers 141-144, the first pick-and-place 150, four second pickers 160, sixteen connectors 170, three unloading stackers US, conveyor TA and controller CA.

[0048] Before explaining the above configuration, first, the test station TS of the sorter will be exp...

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Abstract

The invention designs a sorting machine for testing electronic components. A sorting machine for electronic component testing according to the present invention is characterized in that it includes: a frame for anti-vibration, equipped with a distance from the base, and relatively moving relative to the base, so as to suppress the vibration of the base from affecting the electronic components and the test socket The impact of the electrical connection between; the vibration absorber is interposed between the anti-vibration frame and the base, thereby minimizing the vibration of the base from being transmitted to the anti-vibration frame; the connector is arranged on the anti-vibration frame, and uses The electronic components are electrically connected to the test socket; the receiver supplies the electronic components to be tested to the test socket, or recovers the tested electronic components; and the controller controls the connector and the receiver, wherein the test socket is set in the anti- Shake the frame. According to the present invention, the transmission of vibration can be minimized, so the electrical connection between the electronic component and the tester and the precision of the connection can be maintained, and finally the reliability of the test result can be improved.

Description

technical field [0001] The invention relates to a sorting machine for testing electronic components. Background technique [0002] The electronic components produced will be divided into good products and defective products after being tested by the tester, and only good products will be released from the warehouse. [0003] The electrical connection between the tester and the electronic components is realized by a sorting machine, and the sorting machine is manufactured in various forms according to the types of electronic components to be tested. [0004] Generally, when testing electronic components, the most important thing is the precision of the electrical connection between the electronic component and the tester and the continuity of the connection state. That is, it is important to precisely connect the electronic components and the tester in the sorter and maintain the precise connection state. [0005] However, during operation, the sorter vibrates due to the op...

Claims

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Application Information

Patent Timeline
24 Dec 2021
Publication
CN110394315B
IPC
B07C5/344
CPC
B07C5/344; G01R31/2872; G01R31/2867; G01R31/2893; G01R31/2886; G01R31/2863
Inventors
李相勋; 金平锡