Topological information guided acquisition method for internal geometric data of three-dimensional lattice structural members

A three-dimensional lattice and topology information technology, applied in image data processing, measuring devices, instruments, etc., can solve the problems of poor stability, inability to measure three-dimensional lattice structures, and low measurement efficiency, and achieve stable measurement and improved measurement efficiency. , the effect of reducing the angle error

Active Publication Date: 2019-12-13
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

However, the current three-dimensional lattice structure mainly relies on optical instruments such as profile projectors to measure the external dimensional characteristics, and the measurement benchmark of the lattice structure needs to be defined by human eyes, which not only has low measurement efficiency and poor stability, but also cannot realize the three-dimensional lattice structure. The measurement of the internal geometric data of the

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  • Topological information guided acquisition method for internal geometric data of three-dimensional lattice structural members
  • Topological information guided acquisition method for internal geometric data of three-dimensional lattice structural members
  • Topological information guided acquisition method for internal geometric data of three-dimensional lattice structural members

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Embodiment

[0028] The three-dimensional lattice structural parts are mostly made by 3D printers, including several topological three-dimensional lattice units, and the three-dimensional lattice units are composed of nodes and rods. The three-dimensional lattice unit can have various topological structures, and the target object of this embodiment is a three-dimensional lattice unit with a centrosymmetric topological structure. Figure 1-3 Shown are three typical 3D lattice elements with centrosymmetric topological structure, and the topological structure differences of different 3D lattice elements can be attributed to the nodes ( Figure 1-3 Indicated by letters) and members ( Figure 1-3 represented by numbers in ) differ in the number and spatial location.

[0029] This embodiment takes figure 1 The three-dimensional lattice structural part of the topological structure of the three-dimensional lattice unit shown in is taken as an example. The three-dimensional lattice structural par...

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Abstract

The invention relates to a topological information guided acquisition method for internal geometric data of three-dimensional lattice structural members, which comprises the following steps of scanning three-dimensional lattice structural members through CT (Computed Tomography), extracting all closed contour feature lines from each frame of obtained image data in sequence, and finding out centralpoints of the closed contour feature lines; separating three-dimensional dot matrix units in the three-dimensional dot matrix structural members, and enabling the central point of the rod members contour feature lines in each separated three-dimensional dot matrix unit to correspond to rod members; obtaining a skeleton line of the rod piece by fitting the central points of all the rod piece contour feature lines corresponding to the same rod piece; and carrying out point multiplication on the space vectors corresponding to any two skeleton lines to obtain an included angle between the rod members corresponding to the two skeleton lines. According to the invention, the internal geometric data characteristics of the three-dimensional lattice structural members can be rapidly measured, and the final performance of the three-dimensional lattice structural members can be evaluated.

Description

technical field [0001] The invention relates to a method for acquiring internal geometric data of a three-dimensional lattice structure guided by topological information, and belongs to the technical field of three-dimensional lattice materials. Background technique [0002] Due to the light-weight and high-strength characteristics of the porous microstructure, it can reduce its own weight and reduce material consumption while providing support that meets the needs of use. In this way, the physical properties such as the center of mass and mass of the model can be realized by reasonably adjusting the density distribution of the porous microstructure. The optimized distribution to meet the needs of some specific occasions. [0003] Lattice materials, which have emerged in recent years, have light-weight and high-strength structural forms, open internal spaces, and orderly porous structures. They can meet the requirements of various other functional properties while meeting th...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T19/20G06T7/181G01B15/04G01B15/00
CPCG01B15/00G01B15/04G06T19/20G06T2207/10081G06T7/181
Inventor 戴宁苏仕祥项磊
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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