A Capacitance Prediction Method for Metallized Film Capacitors
A metallized film and prediction method technology, which is applied in the fields of instrumentation, design optimization/simulation, electrical digital data processing, etc., can solve the problem of inability to accurately obtain more information on the actual performance of capacitors, and achieve a simple experimental device and safe and convenient operation. Effect
Active Publication Date: 2021-10-08
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology
[0004] The invention provides a method for predicting the capacitance of metallized film capacitors, which is used to solve the problem that in the prediction of the capacitance of the existing metallized film capacitors, the absolute value of the capacitance cannot be accurately obtained based on the absolute value of the capacitance. Technical issues with current actual performance information
Method used
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Embodiment 1
[0045] A capacitance prediction method 100 for a metallized film capacitor, such as figure 1 shown, including:
[0046] Step 110, setting the sample capacitor in an environment with preset temperature and humidity;
[0047] Step 120, measure the initial capacitance of the sample capacitor, and measure the capacitance once every time the capacitor works for a preset period of time, calculate the capacitance change of the capacitance relative to the initial capacitance until the capacitance change reaches the preset value, and obtain Total working time and multiple capacitance changes;
[0048] Step 130, based on all capacitance changes, fit the relationship curve between capacitance changes and time under multiple time periods, wherein the sum of multiple time periods is the total working time;
[0049] Step 140 , based on the actual service time and initial capacitance of the capacitor under test, select the corresponding relationship curve and predict the current capacitanc...
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The invention discloses a method for predicting the capacitance of a metallized film capacitor, which includes: setting a sample capacitor in a preset temperature and humidity environment; measuring the initial capacitance of the sample capacitor, and measuring once after the capacitor works for a preset period of time Capacitance, calculate the change of the capacitance relative to the initial capacitance, until the total working time reaches the preset time; based on all capacitance changes, the relationship curve of capacitance change and time under multi-stage is obtained by fitting; based on the actual to-be-measured The use time of the capacitor, select the corresponding relationship curve and predict the current capacitance of the capacitor under test. The invention obtains the relative variation of the capacitance based on the initial value, and can compare and analyze the drop conditions of different capacitors. The relationship curve fitted in stages can not only accurately predict the capacitance but also judge the remaining working life. Therefore, the present invention can obtain current performance information of various capacitors while realizing high-precision capacitance prediction, and has strong practicability.
Description
technical field [0001] The invention belongs to the field of capacitor capacitance, and more particularly relates to a method for predicting the capacitance of a metallized film capacitor. Background technique [0002] Metallized film capacitors can be used in safety capacitors, connected between the live wire and the neutral wire of the AC circuit, used to suppress the differential mode interference of the power supply, or used in the resistance-capacitance step-down power supply in series with the AC circuit. Metallized film capacitors as safety capacitors encounter three main risk factors during their working process: continuous AC working voltage, high temperature, and high humidity. Studies have shown that there are two main mechanisms for the capacitance loss of metallized film capacitors: (1) self-healing of the metallized film; (2) electrode oxidation caused by electrochemical corrosion. Due to the long-term working requirements for metallized film capacitors, the w...
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IPC IPC(8): G06F30/20G06F119/02
Inventor 李化李征林福昌刘毅张钦王燕
Owner HUAZHONG UNIV OF SCI & TECH