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Chip structure product aoi testing equipment

A technology for testing equipment and products, applied to measuring devices, instruments, optical devices, etc., can solve problems such as low measurement accuracy and low measurement efficiency

Active Publication Date: 2020-10-23
荣旗工业科技(苏州)股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] like figure 1 , in the wireless charging device, the internal circuit structure contains an electromagnetic coil, and the electromagnetic coil includes a conductive graphite sheet, an upper film, and a lower film. The upper film, the lower film, and the conductive graphite sheet are currently measured by a micrometer, and the actual The measurement accuracy is not high and the measurement efficiency is low

Method used

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  • Chip structure product aoi testing equipment
  • Chip structure product aoi testing equipment
  • Chip structure product aoi testing equipment

Examples

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Embodiment

[0050] refer to figure 1 , is a piece-type structure AOI detection equipment disclosed in the present invention, including a frame 1, an upper machine cover 11 is arranged on the frame 1, and an air purification system 111 is arranged on the upper machine cover 11, and the air purification system 111 is used for filtering Fine dust in the air inside the equipment.

[0051] join figure 2 and Figure 4 , the frame 1 is provided with a transfer tray 2, and the frame 1 is sequentially provided with a feeding station 51, a plane inspection station 52, a thickness inspection station 53, and a discharge station 54 along the outer circumference of the transfer tray 2, A jig 4 is provided on the transfer tray 2, and the jig 4 is used to place the product to be tested. The products tested in this embodiment are the upper film, the lower film and the conductive graphite sheet in the wireless charging device.

[0052] refer to Figure 10 and Figure 11 , The jig 4 is provided with a...

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Abstract

The invention discloses AOI detection equipment for sheet structure products, is applied in the technical field of automatic detection equipment, and solves the existing technical problems of low detection efficiency and low accuracy. The technical solution is that the AOI detection equipment for sheet structure products comprises a rack provided with a transfer tray, wherein the bottom of the rack is provided with a transfer drive device for driving the rotation of the transfer tray, the transfer tray is provided with a jig for placing a product to be tested, and the rack is provided along the outer circumferential direction of the transfer tray in order with a feeding station for placing the product to be tested on the jig; a plane detection station comprising a bottom side light sourcelocated below the transfer tray, a detection frame connected to the rack, a camera terminal located above the transfer tray and connected to the detection frame, and a flattening component connected to the detection frame; a thickness detection station comprising a reference surface measurement component and an opposite surface measurement component; and a discharge station for taking out the product to be tested from the jig. The AOI detection equipment for sheet structure products has the technical effect of high detection precision and efficiency.

Description

technical field [0001] The invention relates to the technical field of automatic testing equipment, in particular to an AOI testing equipment for sheet-type structural products. Background technique [0002] Such as figure 1 , in the wireless charging device, the internal circuit structure contains an electromagnetic coil, and the electromagnetic coil includes a conductive graphite sheet, an upper film, and a lower film. The upper film, the lower film, and the conductive graphite sheet are currently measured by a micrometer, and the actual The measurement accuracy is not high, and the measurement efficiency is low. Contents of the invention [0003] The purpose of the present invention is to provide an AOI testing device for chip structure products, which has the advantages of high detection accuracy and high detection efficiency. [0004] The above-mentioned technical purpose of the present invention is achieved through the following technical solutions: A kind of AOI i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/06G01B11/24G01B11/02G01B21/08
CPCG01B11/02G01B11/06G01B11/24G01B21/08
Inventor 汪炉生钱曙光柳洪哲罗时帅柳云鸿
Owner 荣旗工业科技(苏州)股份有限公司
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