Exception positioning method, device and system causing surface defect and electronic device

A defect and abnormal technology, applied in image data processing, instrumentation, computing, etc.

Active Publication Date: 2019-12-27
HANGZHOU HIKVISION DIGITAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the embodiments of the present invention is to provide a method, device, system, and electronic equipment for locating abnormalities that cause surface defects, so as to accurately locate the abnormalities that cause surface defects

Method used

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  • Exception positioning method, device and system causing surface defect and electronic device
  • Exception positioning method, device and system causing surface defect and electronic device
  • Exception positioning method, device and system causing surface defect and electronic device

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Embodiment Construction

[0074] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0075] In order to accurately locate anomalies that cause surface defects, embodiments of the present invention provide a method, device, system, and electronic equipment for locating anomalies that cause surface defects.

[0076] The terms in the embodiments of the present invention are explained as follows:

[0077] Deep learning: The motivation for deep learning is to allow computers to learn and analyze data in a way that simulates the human brain.

[007...

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Abstract

The embodiment of the invention provides an exception positioning method, device and system causing surface defects and electronic device. The exception positioning method causing the surface defectscomprises: acquiring a defect detection result of a to-be-detected image, the defect detection result comprising defect statistical information in the to-be-detected image, and the to-be-detected image being an image which is shot by an image acquisition device and comprises a detection object; acquiring a to-be-analyzed image matched with the defect statistical information; and detecting and analyzing the image to be analyzed, determining abnormal information associated with the defect statistical information, and the abnormal information comprising abnormal position information. Through thescheme, the exception causing the surface defects can be accurately positioned.

Description

technical field [0001] The invention relates to the technical field of target detection, in particular to an abnormal location method, device, system and electronic equipment that cause surface defects. Background technique [0002] Surface defects refer to defects such as spots, pits, color differences, scratches, and defects on the surface of the product. The surface defects of the product have the characteristics of various types, changeable shapes, unstable positions, and diverse background textures. In the industrial field, surface defects directly affect the aesthetics, performance and other attributes of products. Therefore, the surface quality of products is very important. [0003] In order to ensure the surface quality of the product, it is necessary to detect the surface defects of the product. Surface defect detection methods mainly include manual detection methods and machine learning methods based on deep learning. Through surface defect detection, the positio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/20081G06T2207/20104
Inventor 陈佳伟
Owner HANGZHOU HIKVISION DIGITAL TECH
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