Exception positioning method, device and system causing surface defect and electronic device

Abstract

The embodiment of the invention provides an exception positioning method, device and system causing surface defects and electronic device. The exception positioning method causing the surface defectscomprises: acquiring a defect detection result of a to-be-detected image, the defect detection result comprising defect statistical information in the to-be-detected image, and the to-be-detected image being an image which is shot by an image acquisition device and comprises a detection object; acquiring a to-be-analyzed image matched with the defect statistical information; and detecting and analyzing the image to be analyzed, determining abnormal information associated with the defect statistical information, and the abnormal information comprising abnormal position information. Through thescheme, the exception causing the surface defects can be accurately positioned.

Description

technical field

[0001] The invention relates to the technical field of target detection, in particular to an abnormal location method, device, system and electronic equipment that cause surface defects. Background technique

[0002] Surface defects refer to defects such as spots, pits, color differences, scratches, and defects on the surface of the product. The surface defects of the product have the characteristics of various types, changeable shapes, unstable positions, and diverse background textures. In the industrial field, surface defects directly affect the aesthetics, performance and other attributes of products. Therefore, the surface quality of products is very important.

[0003] In order to ensure the surface quality of the product, it is necessary to detect the surface defects of the product. Surface defect detection methods mainly include manual detection methods and machine learning methods based on deep learning. Through surface defect detection, the positio...

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