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Steady magnetic field test system with adjustable temperature for atom magnetometer

A technology of atomic magnetic strength and testing system, which is applied in the magnetic field measurement using magneto-optical equipment, the magnetic measurement environment, the size/direction of the magnetic field, etc. It can solve the problems of unstabilized field test and uncontrollable temperature.

Inactive Publication Date: 2020-01-03
BEIJING AUTOMATION CONTROL EQUIP INST
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Problems solved by technology

[0003] The invention provides an atomic magnetometer temperature-adjustable stable field test system, which can solve the technical problem that the atomic magnetometer test device in the prior art cannot perform stable field test in a high temperature or low temperature environment due to the uncontrollable temperature of the atomic magnetometer test device

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  • Steady magnetic field test system with adjustable temperature for atom magnetometer
  • Steady magnetic field test system with adjustable temperature for atom magnetometer
  • Steady magnetic field test system with adjustable temperature for atom magnetometer

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Embodiment Construction

[0021] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The following description of at least one exemplary embodiment is merely illustrative in nature and in no way taken as limiting the invention, its application or uses. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0022] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit t...

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Abstract

The invention provides a steady magnetic field test system with adjustable temperature for an atom magnetometer. The steady magnetic field test system with adjustable temperature for the atom magnetometer comprises an atom magnetometer for a steady magnetic field test in an environment to be measured; a thermal insulation device that is internally provided with the atom magnetometer and used to maintain a constant ambient temperature of the atomic magnetometer; a magnetic shielding barrel that is internally inclusive of the thermal insulation device and used to shield interference from an external magnetic field; a temperature adjusting component that is located outside the magnetic shielding barrel and used to adjust the ambient temperature of the atom magnetometer. The technical scheme of the invention is used to solve a technical problem that an atom magnetometer tester in the prior art has a uncontrollable temperature resulting in failure to steady magnetic field test in a high-temperature or low-temperature environment.

Description

technical field [0001] The invention relates to the technical field of magnetometer testing, in particular to an atomic magnetometer temperature-adjustable stable field testing system. Background technique [0002] In the field of magnetometer testing, atomic magnetometer performance testing needs to be carried out in a high-precision and high-stability magnetic field. At present, most field stabilization devices can only perform magnetometer testing at uncontrollable room temperature. With the diversification of engineering applications, it is often necessary to conduct stability tests in high or low temperature environments. However, the temperature of the atomic magnetometer testing device in the prior art is uncontrollable, and it is impossible to realize a stable field test in a high temperature or low temperature environment. Contents of the invention [0003] The invention provides an atomic magnetometer temperature-adjustable stable field test system, which can so...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/00G01R33/032
CPCG01R33/0082G01R33/032
Inventor 秦杰刘栋苏郭宇豪
Owner BEIJING AUTOMATION CONTROL EQUIP INST
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