Two-linear array structured light three-dimensional measuring system and measuring method thereof
A technology of three-dimensional measurement and measurement method, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of measurement accuracy matching accuracy limitation, ineffective matching, etc., and achieve the effect of improving scanning speed, compact structure, and small volume
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0028] Such as figure 1 As shown, a two-line array structured light three-dimensional measurement system measures the surface 5 of the object to be measured through a line array camera A, a line array camera B, a line laser 3, and an optical filter 4, and determines the coordinates of the line array camera A of the measured surface The three-dimensional point coordinate information under the sy...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 


