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Two-linear array structured light three-dimensional measuring system and measuring method thereof

A technology of three-dimensional measurement and measurement method, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of measurement accuracy matching accuracy limitation, ineffective matching, etc., and achieve the effect of improving scanning speed, compact structure, and small volume

Active Publication Date: 2020-01-14
HUAZHONG UNIV OF SCI & TECH
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  • Application Information

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Problems solved by technology

However, if only two line-scan cameras are used to obtain images of the measured object, and three-dimensional information is obtained through stereo matching, the measurement accuracy is limited by the matching accuracy.
And when the surface to be tested lacks texture or features, it generally cannot be effectively matched

Method used

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  • Two-linear array structured light three-dimensional measuring system and measuring method thereof
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  • Two-linear array structured light three-dimensional measuring system and measuring method thereof

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Embodiment Construction

[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0028] Such as figure 1 As shown, a two-line array structured light three-dimensional measurement system measures the surface 5 of the object to be measured through a line array camera A, a line array camera B, a line laser 3, and an optical filter 4, and determines the coordinates of the line array camera A of the measured surface The three-dimensional point coordinate information under the sy...

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Abstract

The invention belongs to the technical field of robot vision three-dimensional measurement, and discloses a two-linear array structured light three-dimensional measuring system and a measuring methodthereof. The method comprises the following steps: (a) forming a straight line with different brightness on the surface of an object to be measured by using a laser; (b) shooting straight lines of a the object to be measured by two linear array cameras so as to obtain two linear images, and determining the image coordinates of points P1 and P2 corresponding to points P on the straight lines on thetwo linear images; (c) respectively connecting points P1 and P2 with light centers of respective corresponding linear array cameras to form two intersecting straight lines, and calculating intersection point coordinates to obtain coordinates of points P; and (d) repeating the step (c) until the coordinates of all the points on the straight line are obtained, changing the position of the object tobe measured so as to change the position of the straight line on the surface of the object to be measured, and returning to the step (a) until the three-dimensional coordinates of all the points on the surface of the object to be measured are obtained. According to the method, the three-dimensional coordinates of the measured object are accurately measured and are not influenced by the surface quality of the measured object.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional measurement of robot vision, and more specifically relates to a two-line array structured light three-dimensional measurement system and a measurement method thereof. Background technique [0002] In recent years, with the development of industrial technology, the demand for the measurement of real-world three-dimensional structures has become more and more extensive. Among them, in terms of structured light, point structured light technology, line structured light technology and surface structured light technology have been mainly developed. The line structured light sensor is mainly composed of an area array camera and a line laser, and the pose relationship of the line laser plane in the camera coordinate system is determined through calibration, so as to realize three-dimensional measurement by triangulation. However, due to the limited shooting speed of the area array camera, the t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
CPCG01B11/002
Inventor 李晨张旭赵欢丁汉
Owner HUAZHONG UNIV OF SCI & TECH