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Abnormality monitoring method and abnormality monitoring device

An abnormality monitoring and abnormality technology, applied in image data processing, instrument, character and pattern recognition, etc., can solve problems such as difficult to predict abnormality

Inactive Publication Date: 2020-03-03
株式会社明和E TEC
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0002] Sensors are installed on the monitored object to detect abnormal operation of the monitored object such as a machine, but it is difficult to predict the abnormality when detecting the abnormality only based on the fact that the detection signal obtained from each sensor exceeds the threshold when it suddenly increases or decreases. symptoms to take countermeasures as soon as possible

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  • Abnormality monitoring method and abnormality monitoring device
  • Abnormality monitoring method and abnormality monitoring device
  • Abnormality monitoring method and abnormality monitoring device

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Embodiment Construction

[0020] In addition, the embodiment described below is only an example, and various design improvements made by those skilled in the art also belong to the scope of the present invention without departing from the gist of the present invention.

[0021] figure 1 Shows the overall structure of an abnormality monitoring device implementing the method of the present invention. exist figure 1 Among them, sensors 11 such as vibration sensors, temperature sensors, acceleration sensors, sound sensors, voltage sensors, and position sensors are installed on monitoring objects 1 such as industrial robots and machine tools to detect abnormal operation, and the transmission from these sensors 11 to personal computers (PC) 2 inputs timing measurement data (monitoring data) 11a.

[0022] In the abnormality monitoring device, learning processing is first performed on monitoring data of one or more periods when the monitoring object is normal. figure 2 Indicates the steps of the learning p...

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Abstract

Provided are an abnormality monitoring method and an abnormality monitoring device capable of reliably detecting an abnormality of an object to be monitored and a sign of the abnormality. Time-seriesmonitoring data is acquired from an object to be monitored, a wavelet image is calculated on the basis of the monitoring data, a feature amount at each point of the wavelet image is calculated, and whether or not the object to be monitored is abnormal is determined on the basis of the feature amount. The feature amount uses a moment from a predetermined origin on the wavelet image. Based on the Mahalanobis distance calculated according to the characteristic quantity, whether the monitored object is abnormal is determined.

Description

technical field [0001] The present invention relates to an abnormality monitoring method and an abnormality monitoring device for determining the presence or absence of an abnormality in a monitoring object such as a machine. Background technique [0002] Sensors are installed on the monitored object to detect abnormal operation of the monitored object such as a machine, but it is difficult to predict the abnormality when detecting the abnormality only based on the fact that the detection signal obtained from each sensor exceeds the threshold when it suddenly increases or decreases. Symptoms to take countermeasures as soon as possible. [0003] In addition, Patent Document 1 proposes a monitoring system that uses a feature parameter based on time waveform data and a feature parameter based on frequency domain data as feature parameter parameters of a plurality of waveform data obtained from a monitoring object. Based on these The data calculates the Mahalanobis distance, an...

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Application Information

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IPC IPC(8): G06K9/00G06K9/52G06T7/00
CPCG06T7/0002G06T2207/30232G06V20/52G06V10/52
Inventor 山田浩臣喜田博一石川坂幸
Owner 株式会社明和E TEC