A fast correction method for vector calibration for large-signal testing

Abstract

A vector network testing device, characterized in that the information exchange network of the device includes a vector network analyzer, a device to be tested, an error network A, an error network B and two AC power networks; the error network A includes a to-be-measured network A biaser, a coupler, a source-side tuner, and a connection line between the devices at the source end of the device; the error network B includes a biaser, a coupler, a load-end tuner, and the connection between the devices at the load end of the device under test The vector network analyzer adopts a double reflection structure; the present invention reduces the influence of drift error as little as possible by training the neural network and applying the neural network to correct the error coefficient in real time, and avoids repeated and tedious vector calibration.

Description

technical field [0001] The invention belongs to the field of radio frequency integrated circuit testing, and relates to an improved calibration method for automatically repairing drift errors in vector network testing. Background technique [0002] In order to successfully complete the design of microwave / millimeter wave integrated circuits, achieve higher performance, higher integration, etc., while reducing the number of design iterations, it is necessary to design various semiconductor devices such as active and passive devices and interconnect structures. Carry out accurate tests, develop accurate device models on this basis, and combine corresponding circuit design techniques to achieve successful design of RF integrated circuits. Such tests are generally carried out relying on the vector network test system. [0003] The vector network test uses a vector network analyzer (VNA) as the main test instrument, and evaluates the performance of the device by obtaining the ab...

AI Technical Summary

Problems solved by technology

As a result, in the actual test, the vector calibration can only be continuously re-calibrated to reduce the drift error

In this way, on the one hand, it takes a lot of time to calibrate the system; on the other hand, it is difficult to guarantee the consistency of test data when performing long-term and large-scale tests on multiple devices.

The above problems seriously hinder the rapid iteration and precise design of integrated circuit design, and urgently need to be solved

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