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Distance measurement image pickup apparatus

A camera device and ranging system technology, applied in the direction of measuring devices, radiation control devices, image communication, etc., can solve problems such as difficulty in reducing ranging errors, increasing interfering light ranging errors, increasing the number of consecutive exposure gates, etc., to achieve Effects of reduced ranging error, wide ranging range, and high ranging accuracy

Active Publication Date: 2020-04-10
HITACHI-LG DATA STORAGE
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  • Summary
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  • Description
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  • Application Information

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Problems solved by technology

[0009] In addition, it is also considered to set the non-exposure period in the continuous method and change the length of the non-exposure period in the same way as the pulse method, but as described later, there are the following problems: it is necessary to increase the continuous number of exposure gates, which is caused by interference light. The ranging error increases
In addition, in the case of changing the pulse width, the distance measurement range changes due to the change of the pulse width, so the pulse width cannot be greatly changed, so it is difficult to reduce the distance measurement error caused by the disturbance light
[0011] In this way, in the method of measuring distance using two kinds of irradiation light with high modulation frequency and low modulation frequency described in International Publication No. 2017 / 022152, high ranging accuracy and wide ranging range can be obtained, but it is difficult to reduce the distance caused by Ranging error caused by interference between multiple ranging cameras

Method used

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Examples

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no. 1 example

[0061] Figure 5 is a timing chart showing light emission exposure in the first embodiment.

[0062] (a) shows the light emission / exposure timing of the first distance measurement period. The short pulse width 1T is used for the light emission pulse, and it is exposed through an exposure gate having the same width 1T (high modulation frequency). Regarding the exposure period, exposure is performed in periods A, B, and C after shifting the timing by 1T one by one, but in each period, it is turned on three times at a period of 3T from one light-emitting pulse to the next light-emitting pulse (reference numeral 35 ). The exposure gate is repeatedly exposed (reference numerals 31, 32, 33). This is the "extended pulse method" introduced in this embodiment. Also, a first non-exposure period 36 (here, a width of 10T) not exposed is provided from closing of the last exposure gate (reference numeral 34 ) to emission of the next pulse light (reference numeral 35 ). Thus, the pulse l...

no. 2 example

[0126] In the second embodiment, an example in which the pulse width and the number of repeated exposures are different from those in the first embodiment will be described.

[0127] Figure 14 A timing chart of light emission exposure in the second embodiment is shown.

[0128] (a) shows the light emission / exposure timing of the first distance measurement period. The light emission pulse uses a short pulse width of 1T. The exposure period is exposed in periods A, B, and C in which the timing is shifted one by one by 1T, but in each period, exposure is repeated by opening the exposure gate twice at a period of 3T for one light emission pulse (reference numerals 81, 82, 83 ). That is, in this case also, it is "extended pulse method". Also, from closing of the last exposure gate (reference numeral 84 ) to emission of the next pulse light (reference numeral 85 ), a first non-exposure period 86 (here, a width of 13T) not exposed is provided. Thus, the pulse light interval 80 ...

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Abstract

A distance measurement image pickup apparatus can realize high distance measurement precision and a wide distance measurement range at the same time to reduce interference during operation of a plurality of apparatuses. In a first distance measurement period, short pulsed light (1T) is irradiated, and exposure is performed in a plurality of exposure periods (A, B, and C) in which exposure timingsare shifted. In each exposure period, exposure is repeatedly performed by opening the exposure gate a plurality of times from one pulsed light to the next, and a first non-exposure period is providedfrom closing the last exposure gate to irradiating the next pulsed light. In a second distance measurement period, long pulsed light (4T) is irradiated, and exposure is performed in a plurality of exposure periods (A, B, and C) in which exposure timings are shifted. In each exposure period, exposure is performed by opening the exposure gate only once during a period from one pulsed light to a nextpulsed light, and a second non-exposure period is provided from closing the exposure gate to irradiating the next pulsed light.

Description

[0001] This application claims priority from Japanese Patent Application JP2018-187826 filed on October 3, 2018, the contents of which are incorporated herein by reference. technical field [0002] The present invention relates to a distance measuring camera device for measuring the distance to an object based on the time-of-flight of light. Background technique [0003] As a method of measuring a distance to an object, there is known a TOF (Time Of Flight) method in which a distance is measured based on the time of flight until irradiated light is reflected by the object and returns. Specifically, exposure is performed in a plurality of exposure gates in which the exposure timing is shifted from the emission timing of the intensity-modulated irradiation light, and the time delay of the reflected light relative to the irradiation light is calculated from the exposure amount accumulated in each exposure gate. Find the distance. [0004] In the TOF method, ranging accuracy (r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/10
CPCG01S7/4865G01S17/894H04N23/60G01S17/10G01S7/4815G01S7/483G01S7/487G01S17/04G01S17/18G01S17/32G01S17/42H01L27/146H01L27/14601H04N23/73H04N25/71
Inventor 神定利昌增田浩三杉山久贵新谷俊通
Owner HITACHI-LG DATA STORAGE
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