Testing machine and chip testing method
A technology for testing machines and machines, which can be used in testing optical performance, electronic circuit testing, optical instrument testing, etc., and can solve problems such as poor light source signal quality
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[0027] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.
[0028] See Figures 1 to 3 , figure 1 shows a schematic diagram of the internal structure of the test machine provided by the embodiment of the present application, figure 2 and image 3 A schematic diagram of the exterior of the test bench is shown. The test machine includes: a machine shell 110, a PCB board (not shown) and a light source device 120, wherein the PCB board is arranged in the inside of the machine shell 110, and the light source device 120 is fixedly installed in the inside of the machine shell 110 . The installation direction of the light source device 120 forms a first preset angle with the first surface 111 of the machine case 110 . The first surface 111 is the light emitting surface of the test machine, and the light emitting surface is provided with a light outlet, and the...
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