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Testing machine and chip testing method

A technology for testing machines and machines, which can be used in testing optical performance, electronic circuit testing, optical instrument testing, etc., and can solve problems such as poor light source signal quality

Pending Publication Date: 2020-05-29
悦芯科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the embodiments of the present application is to provide a testing machine and a chip testing method to improve the problem of poor signal quality of the light source existing in the prior art

Method used

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  • Testing machine and chip testing method
  • Testing machine and chip testing method
  • Testing machine and chip testing method

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Embodiment Construction

[0027] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

[0028] See Figures 1 to 3 , figure 1 shows a schematic diagram of the internal structure of the test machine provided by the embodiment of the present application, figure 2 and image 3 A schematic diagram of the exterior of the test bench is shown. The test machine includes: a machine shell 110, a PCB board (not shown) and a light source device 120, wherein the PCB board is arranged in the inside of the machine shell 110, and the light source device 120 is fixedly installed in the inside of the machine shell 110 . The installation direction of the light source device 120 forms a first preset angle with the first surface 111 of the machine case 110 . The first surface 111 is the light emitting surface of the test machine, and the light emitting surface is provided with a light outlet, and the...

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Abstract

The invention provides a testing machine and a chip testing method, and relates to the technical field of chip testing. The testing machine comprises a machine shell; a PCB arranged in the machine shell; a light source device fixedly mounted in the machine shell, and a first preset angle is formed between the mounting direction of the light source device and the first surface of the machine tableshell. The first surface is a light-emitting surface, a light outlet is formed in the light-emitting surface, and light emitted by the light source device penetrates out of the light outlet. The lightsource device required by testing is integrated in the testing machine provided by the invention, the integration degree is high, the space of the light source structure is specially reserved in themachine, the light source can be made larger, a light source with better light quality can be placed in the machine. Compared with an external small light source in the prior art, the light signal quality is improved, meanwhile, the testing time can be shortened, and the testing efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of chip testing, in particular to a testing machine and a chip testing method. Background technique [0002] The CIS (CMOS Image Sensor) chip is a key component of the camera. The CIS chip captures image information by converting optical signals into digital electrical signals. As the core chip of camera products, it determines the imaging quality of the camera. The test of CIS chip is an important link in the production process of CIS chip. Existing test machines for testing CIS chips generally use external light sources, and the external light sources are placed in a space less than 10 cm between the PCB board and the machine. The external light source is usually small and short, and the light diameter is also small, which will directly lead to problems such as poor signal quality of the light source and insufficient uniformity of the light source, making it impossible to effectively test high-p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04G01M11/04G01M11/02
CPCG01R31/2884G01R31/2886G01R1/0408G01R1/0416G01M11/04G01M11/0207
Inventor 张悦
Owner 悦芯科技股份有限公司
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