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Withstand voltage test device and withstand voltage test method of transformers

A technology for withstand voltage testing and transformers, which is applied in the direction of transformer testing, measuring devices, measuring device casings, etc., can solve the problems of long test time and low test efficiency, and achieve the effect of improving test efficiency and high automation level

Active Publication Date: 2020-06-16
DEZHOU XINPING ELECTRONICS
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  • Claims
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AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present invention abandons the method of manually loading and testing transformers in the prior art, and provides a transformer withstand voltage test device and a withstand voltage test method, which solves the technical problems of long test time and low test efficiency in the prior art

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  • Withstand voltage test device and withstand voltage test method of transformers

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Embodiment Construction

[0041] Other objects and advantages of the present invention will become clear by explaining the following preferred embodiments of the present invention.

[0042] For the convenience of description, the "up", "down", "left" and "right" referred to below are consistent with the up, down, left and right directions of the drawings themselves, but do not limit the structure of the present invention. figure 1 The arrow in indicates the specific direction of the front, where the opposite of the front is the rear.

[0043] Firstly, a voltage withstand test device for a transformer according to an embodiment of the present invention will be described.

[0044] refer to Figure 1-Figure 8 As shown, a transformer withstand voltage test device is used for withstand voltage test in the transformer production process, including a box 100, a delivery unit 200, a test unit 300 and a control unit.

[0045] Wherein, the box body 100 plays a supporting role, and the box body 100 is provided ...

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Abstract

The invention relates to the technical field of transformer testing, in particular to a withstand voltage testing device and a withstand voltage testing method of transformers. The withstand voltage testing device comprises a testing unit, a plurality of conveying units arranged at intervals in the front-back direction and a control unit, wherein the test unit is provided with a plurality of teststations; the control unit is respectively connected with the plurality of conveying units, and the control unit controls the conveying units to convey transformers to be tested to the corresponding test stations for voltage withstanding test or output the tested transformers, and accumulates the test time of the transformers. The plurality of transformers can be placed on the plurality of conveying units, and the control unit controls the conveying units to operate to the test stations of the test units to carry out voltage withstanding tests and can monitor the test time of the transformerson each conveying unit; and when the testing time reaches a preset value, the conveying units are controlled to output the transformers, withstand voltage testing can be conducted on a plurality of the transformers at a time, and the testing efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of transformer testing, in particular to a transformer withstand voltage test device and a withstand voltage test method. Background technique [0002] The transformer withstand voltage test (externally applied high voltage test) is mainly to check whether the main insulation of the transformer is qualified, that is, the insulation condition between the primary coil and the secondary coil, between them and the iron core and the shell. If it is unqualified, it will not only endanger the transformer itself and other connected electrical devices, but also cause danger to the equipment and personnel using electricity. [0003] In the transformer withstand voltage test in the prior art, the testing machine can only test one transformer at a time. Generally, it takes 3 minutes to test the transformer, and the test time is relatively long. On the one hand, it leads to low transformer testing efficiency, which is n...

Claims

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Application Information

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IPC IPC(8): G01R31/12G01R31/62G01R1/04
CPCG01R31/1227G01R1/0425
Inventor 王海燕李培信崔亭武
Owner DEZHOU XINPING ELECTRONICS
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