Unlock instant, AI-driven research and patent intelligence for your innovation.

Abnormal information processing node analysis method and device, medium and electronic equipment

A node analysis and anomaly technology, applied in the computer field, can solve problems such as inability to mine risk laws, low efficiency of abnormal information processing node analysis, and lack of predictability of abnormal events

Active Publication Date: 2020-06-26
PING AN TECH (SHENZHEN) CO LTD
View PDF11 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, when analyzing abnormal information processing nodes, the risk analysis of security incidents only stays in non-quantitative analysis such as empirical theory and inductive analysis of scattered cases, which cannot dig out the hidden risk laws, and the analysis efficiency of abnormal information processing nodes is low. , lack of predictability for unusual events that occur

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Abnormal information processing node analysis method and device, medium and electronic equipment
  • Abnormal information processing node analysis method and device, medium and electronic equipment
  • Abnormal information processing node analysis method and device, medium and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051]Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this application will be thorough and complete, and will fully convey the concepts of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the present application. However, those skilled in the art will appreciate that the technical solutions of the present application can be practiced without one or more of the specific details, or other methods, components, devices, steps, etc. can be used. In other instances, well-known technical solutions have not be...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an abnormal information processing node analysis method and apparatus, a medium and an electronic device, and belongs to the technical field of computers. The method comprisesthe steps of classifying information processing nodes according to attributes of abnormal information processing events; obtaining abnormal feature tags of all information processing nodes, and constructing a node tag set; eliminating labels with the occurrence probability lower than a preset threshold value in the node label set to obtain a frequent item label set; according to a predetermined class association relationship of the class of the information processing node group, obtaining the same label in the frequent item label set of the information processing node group corresponding to the associated class to obtain a same label subset; associating group association feature tags for the same tag subset to obtain an association relationship tag set; and inputting the related information of the abnormal information processing event in the abnormal node analysis request and the association relationship label set into a risk node analysis model to obtain an abnormal information processing node relationship. According to the invention, the abnormal information processing node relationship can be efficiently and accurately analyzed.

Description

technical field [0001] The present application relates to the field of computer technology, in particular, to an analysis method, device, medium and electronic equipment for abnormal information processing nodes. Background technique [0002] Abnormal information processing node analysis is to analyze the information processing nodes in relevant subjects (such as enterprises) when abnormal information processing events (such as information leakage, loss, management errors, etc.) occur, and determine the suspects in all abnormal information processing events. Association relationship between nodes. [0003] At present, when analyzing abnormal information processing nodes, the risk analysis of security incidents only stays in non-quantitative analysis such as empirical theory and inductive analysis of scattered cases, which cannot dig out the hidden risk laws, and the analysis efficiency of abnormal information processing nodes is low. , lack of foresight to the occurrence of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L29/06
CPCH04L63/1425H04L63/1416
Inventor 侯方舟
Owner PING AN TECH (SHENZHEN) CO LTD