Method and equipment for low latency storage performance testing

A storage performance and low latency technology, applied in the computer field, to achieve low latency and improve storage test performance

Inactive Publication Date: 2020-07-03
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In view of this, the purpose of the embodiment of the present invention is to propose a low-latency method and device for storage performance testing. By using the method of the present invention, the IO test can be started in the background without affecting the IOPS of the test. High test failure problem, improve storage test performance

Method used

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  • Method and equipment for low latency storage performance testing
  • Method and equipment for low latency storage performance testing

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Embodiment Construction

[0030] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0031] Based on the above purpose, the first aspect of the embodiments of the present invention proposes an embodiment of a method for low-latency storage performance testing. figure 1 Shown is a schematic flow chart of the method.

[0032] Such as figure 1 As shown in , the method may include the following steps:

[0033] S1 sets the path of the IO test as the path of the storage performance test, and the hard disk selected for the test must be consistent with the hard disk of the storage performance test, otherwise the test is meaningless;

[0034] S2 Set the IOPS size of the IO test to the preset threshold, set the ratio of the IO test items to the preset ratio, specify and set the size of the IOPS...

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Abstract

The invention provides a method and equipment for low delay of a storage performance test. The method comprises the following steps: setting a path of an IO test as a path of the storage performance test; setting the IOPS size of the IO test as a preset threshold, and setting the IO test item proportion as a preset proportion; in response to a received IO test instruction, executing an IO test according to the IO test item under the path and monitoring IO information; and in response to the IO information reaching the stable state, starting a storage performance test. By using the scheme provided by the invention, the problem of test failure caused by too high test delay can be solved by starting the IO test through the background under the condition of not influencing the IOPS of the test, and the storage test performance is improved.

Description

technical field [0001] This field relates to the computer field, and more specifically relates to a low-latency storage performance test method and device. Background technique [0002] The storage performance test is aimed at the performance of the storage subsystem when executing key business applications. These applications are mainly characterized by random IO operations, including query and update operations. Examples of such applications include OLTP, database operations, and mail server operations. Because mid-to-high-end storage systems often serve as the data base platform for key business applications in the user's system environment. [0003] In the storage performance test, a key indicator for the test to pass successfully is the test delay. The test tool we use is to first set an IOPS (the number of read and write (I / O) operations per second) value, that is, the storage system per second The number of times to read and write data reflects the performance of t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
CPCG06F11/221G06F11/2273
Inventor 李艳
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD
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