Geometric dimension measuring device for silicon rod production
A technology of geometric dimensions and measuring devices, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of undetectable structure, quality and other properties, single function, no metallographic microscope, etc., to reduce complicated operations, Improve detection accuracy and facilitate adjustment
Inactive Publication Date: 2020-08-28
徐发喜
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Problems solved by technology
[0003] However, the existing geometric measurement devices for the production of silicon rods have relatively single functions, and only have the function of measuring geometric dimensions. Generally, there is no metallographic microscope, and the structure, quality and other properties cannot be detected.
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[0017] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0018] see Figure 1-2 , the present invention provides a technical solution: a geometric dimension measuring device for silicon rod production, including a numerical control box 1, a metallographic microscope 201, a measurement and control device 4 and an integrated detection box 5, and a first display is embedded in the top of the numerical control box 1 101, the side of the first display 101 is connected with an operation button 102, the front upper end of ...
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The invention discloses a geometric dimension measuring device for silicon rod production. The device comprises a numerical control box, a metallographic microscope, a measurement and control device and an integrated detection box, and a first display is embedded in the top end of the numerical control box; the side surface of the first display is connected with operation buttons; and a second display is arranged at the front upper end of the numerical control box. According to the geometric dimension measuring device for silicon rod production, the integrated detection box comprises a laser feedback shape detection part, a temperature and resistance detection part and an infrared and ultrasonic hybrid three-dimensional shape imaging part, multiple steps of silicon rod detection are integrated, complex operation is reduced, meanwhile, the overall detection precision is improved, the second display is arranged and is directly communicated with the integrated detector, various parametersdetected by the integrated detector are combined and analyzed to form a three-dimensional image to be displayed, and the three-dimensional image is referenced with a plane graph displayed by the first display, so that detection personnel can conveniently adjust the three-dimensional image, various parameters of the silicon rod can be accurately measured, and the practicability of the device is improved.
Description
technical field [0001] The invention relates to the technical field of silicon rod testers, in particular to a geometric dimension measuring device for silicon rod production. Background technique [0002] Testers are mainly electronic equipment, measuring instruments and electronic application instruments, which refer to instruments, equipment and systems that use electronic technology to measure, observe electricity or non-electricity, or provide light, electricity, and measurement accessories for measurement purposes. Measurements include Data collection, storage, display, printing, drawing, processing and transmission, etc., are information products. [0003] However, the existing geometric dimension measuring devices for the production of silicon rods have relatively simple functions, and only have the function of measuring geometric dimensions. Generally, there is no metallographic microscope, and the structure, quality and other properties cannot be detected. [0004...
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IPC IPC(8): G01D21/02G01B11/24
CPCG01B11/24G01D21/02
Inventor 吕伟南
Owner 徐发喜