Quantitative evaluation method, device and storage medium for reliability enhancement test
A quantitative evaluation and reliability technology, applied in design optimization/simulation, instrumentation, probabilistic CAD, etc., can solve problems such as quantitative evaluation of product reliability level
Active Publication Date: 2021-05-11
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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Problems solved by technology
[0004] During the implementation process, the inventors found at least the following problems in the traditional technology: the current reliability enhancement test cannot quantitatively evaluate the reliability level of the product
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[0052]In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0053] It can be understood that the terms "first", "second" and the like used in this application may be used to describe various elements herein, but these elements are not limited by these terms. These terms are only used to distinguish one element from another element.
[0054] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to the other element, or connected to the other element through an intervening element. In addition, "connection" in the following embodiments should be understood as "electri...
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The application relates to a quantitative evaluation method, device and storage medium of a reliability enhancement test. Among them, the quantitative evaluation method of the reliability enhancement test includes the steps of: determining the stress type and the test stage of the reliability enhancement test of the electronic product to be tested, and obtaining the failure handling strategy of the reliability enhancement test; the failure handling strategy includes the failure handling method; The reliability enhancement test of the tested electronic products is carried out to obtain the fault data; based on the fault handling method, the stress type and the test stage, the corresponding acceleration model is used to extrapolate the fault data to obtain the fault data under the normal stress level; The reliability evaluation of the fault data is carried out, and the reliability index of the electronic product under test is obtained. This application realizes the quantitative evaluation of the reliability test data.
Description
technical field [0001] The present application relates to the technical field of electronic product testing, in particular to a method, device and storage medium for quantitative evaluation of reliability enhancement tests. Background technique [0002] In the development process of modern weapons and equipment, not only higher requirements are put forward for the performance indicators of weapons and equipment, but also special emphasis is placed on the need for weapons and equipment to have a higher level of reliability. However, the reliability level of the product is a process of continuous growth and spiral rise. [0003] The reliability growth test plays an important role in ensuring the improvement of the reliability level of weapons and equipment. Through the reliability growth test, product design defects can be exposed, and improvement measures can be taken to achieve the purpose of improving product reliability. At the same time, the reliability of the product can...
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IPC IPC(8): G06F30/20G06F119/14G06F119/02G06F111/08
CPCG06F30/20G06F2111/08G06F2119/02G06F2119/14
Inventor 谢丽梅胡湘洪黄永华熊伊孔叔钫沈峥嵘王春辉时钟李劲
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST