Inspection method and inspection device
An inspection method and inspection device technology, which can be used in the testing of measuring devices, instruments, optical instruments, etc., and can solve problems such as being easily recognized visually.
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no. 1 approach ＞
[0040] The inspection device and inspection method of the first embodiment will be described.
[0041] (Inspection device and object to be inspected)
[0042] The inspection device of this embodiment is a device for inspecting the presence or absence of surface defects in a linear polarizing plate. Such as figure 1As shown, the inspection apparatus 100A is formed by sequentially arranging a light source 2 , a phase difference plate 4 , and a linear polarizing filter (polarizing filter) 3A.
[0043] Such as figure 2 As shown, a film-like inspection object 10A as an inspection object includes: a linear polarizing plate 1A as an inspection object main body; and a release film 16 a laminated on the linear polarizing plate 1A via an adhesive layer 15 . 1 A of linear polarizing plates are formed by bonding protective films 12 a and 12 b to both surfaces of a polarizing film 11 . Furthermore, another release film 16b is laminated on the surface of the linear polarizing plate 1A ...
no. 2 approach ＞
[0079] An inspection device and an inspection method according to a second embodiment will be described. Such as Figure 6 As shown, the inspection apparatus 100B of the second embodiment differs from the inspection apparatus 100A of the first embodiment in that the position where the object 10A is disposed is opposite to the position where the linear polarization filter 3A is disposed. That is, the inspection device 100B is formed by sequentially arranging the light source 2, the linear polarizing filter 3A, and the retardation plate 4, and the object 10A to be inspected is arranged in a phase opposite to the phase so that the release film 16a faces the light source 2 side during inspection. The difference plate 4 is farther away from the light source 2 than the position. It should be noted that, similarly to the above-mentioned first embodiment, when attaching the release film 16b to the polarizing plate 1A and compensating for the retardation value of the release film 16b,...
no. 3 approach ＞
[0082] An inspection device and an inspection method according to a third embodiment will be described.
[0083] (Inspection device and object to be inspected)
[0084] The inspection device of this embodiment is different from the first embodiment in that it inspects the presence or absence of surface defects in a circularly polarizing plate. The difference from the first embodiment is that a film-like inspection object 10B to be inspected includes a circular polarizing plate 1B; and accordingly, a phase difference filter 3B is used instead of the linear polarizing filter 3A. Hereinafter, points different from the first embodiment will be described.
[0085] Such as Figure 7 As shown, the inspection apparatus 100C is formed by arranging a light source 2 , a retardation plate 4 , and a retardation filter (polarizing filter) 3B in this order.
[0086] Such as Figure 8 As shown, a film-like inspection object 10B to be inspected includes: a circularly polarizing plate 1B as...
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Abstract
Description
Claims
Application Information
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