Sensitive error weight calculation method for Cartesian coordinate system contour scanning measurement
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- NAT UNIV OF DEFENSE TECH
- Publication Date
- 2020-10-20
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Abstract
Description
technical field
[0001] The present application relates to the technical field of machine tool design and manufacture and error measurement compensation, in particular to a method for calculating sensitive error weights for contour scanning measurement in a Cartesian coordinate system. Background technique
[0002] Influenced by the machine topology and manufacturing process, each machine tool has its own typical main error sources and process characteristics. In order to quickly and accurately control the main error sources of the machine tool and obtain high compensation efficiency, it is necessary to predict the error sources of the machine tool with high reliability.
[0003] Geometric error is the main source of error affecting the accuracy of machine tools. In equipment such as three-coordinate measuring machines and three-axis processing machine tools, 21 geometric error parameters are generally used to describe the basic geometric errors of the equipment, including t...