BMS system test load device

Abstract

The invention provides a BMS system test load device which can provide various load signals and can adopt a semi-automatic control mode, so that the test efficiency is improved, the test data are morecomplete, and the detection result is more accurate. The BMS system test load device comprises a BMS system, the BMS system is connected with a high-side driving load module, a low-side driving loadmodule, a double-side driving load module, a digital quantity signal module, an adjustable pull-up and pull-down resistance load module, a PWM signal source module, a CC / CC2 resistance load module andan insulation detection load module. The high-side driving load module, the low-side driving load module, the double-side driving load module, the digital quantity signal module, the adjustable pull-up and pull-down resistance load module, the PWM signal source module, the CC / CC2 resistance load module and the insulation detection load module are respectively connected with a master control single-chip microcomputer. The master control single-chip microcomputer is connected with an upper computer.

Description

technical field [0001] The invention relates to the technical field of a battery management system debugging device, in particular to a BMS system test load device. Background technique [0002] Battery management system (Battery management system) is referred to as BMS. After the initial sample design of the BMS product is completed, it needs to enter the debugging and testing stage. The part that takes the longest time in the debugging and testing work and affects the work efficiency the most is the construction of the test environment. In order to simulate various input and output requirements of BMS products, test engineers need to build various signals or loads. Most of the existing test load boxes have fewer load signals and are manually operated. Before operation, the operator needs to understand the structure and principle of the load box before building, which not only takes a long time, affects the test efficiency, but also leads to incomplete test data. , affec...

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problem that the existing BMS has fewer load signals and is manually operated during the debugging and testing phase, it takes a long time, affects the test efficiency, and at the same time causes the test data to be incomplete and affects the overall test results. The present invention provides a A BMS system test load device, which can provide a variety of load signals, and it can adopt a semi-automatic control method, so that the test efficiency is improved, and its test data is more complete, so that the test results are more accurate

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