Test board anti-insertion structure for radio frequency chip and test device for radio frequency chip
A technology of radio frequency chip and test board, which is applied in the fields of test board anti-insertion structure and radio frequency chip test device, can solve problems such as company loss and abnormal quality, and achieve the effect of ensuring accuracy
Active Publication Date: 2022-08-05
广东利扬芯片测试股份有限公司
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[0002] In the prior art, the test frequency range of the tested chip is 0MHz-5GHz, which belongs to the radio frequency test. When multiple test boards (DUTs) are tested, in order to reduce the interference of the test boards, the multi-DUT boards are separated separately, although it can effectively reduce the DUT. interference, but it also brings another problem. During the test, the DUT may be installed reversely when disassembling the test board, which will cause the opposite result returned to the test machine, that is, the results of DUT1 and DUT2 are exchanged, resulting in serious The quality of the product is abnormal, which will bring huge losses to the company
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[0032] The following will refer to the appendix Figure 1 to Figure 4 Specific embodiments of the present invention are described in more detail. While specific embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present invention will be more thoroughly understood, and will fully convey the scope of the present invention to those skilled in the art.
[0033] It should be noted that certain terms are used in the description and claims to refer to specific components. It should be understood by those skilled in the art that the same component may be referred to by different nouns. The description and the claims do not use the difference in terms as a way to distinguish components, but use the difference in function of the components as a criterion for distinguishing. A...
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Disclosed are a test board anti-insertion and anti-reverse structure for a radio frequency chip and a radio frequency chip testing device. In the test board anti-insertion and anti-reverse structure, a test board set includes a first test board adapted to a first chip connecting device and a test board adapted to The second test board of the second chip connection device, the first test board and the second test board are arranged vertically and horizontally in sequence, the first test board includes a first pad that is adapted and electrically connected to the first chip connector, and the first test board is arranged vertically and horizontally. The two test boards include second pads that are adapted and electrically connected to the second chip connector, the sum of the third spacing and the fifth spacing is smaller than the first spacing, the sum of the third spacing and the fourth spacing is greater than the first spacing, the second spacing The sum of the distance and the fifth distance is greater than the first distance, and the sum of the second distance and the fourth distance is greater than the first distance.
Description
technical field [0001] The invention relates to the technical field of chip testing, in particular to a test board anti-insertion and reverse structure for a radio frequency chip and a radio frequency chip testing device. Background technique [0002] In the prior art, the test frequency range of the chip under test is 0MHz-5GHz, which belongs to the radio frequency test. When testing multiple test boards (DUTs), in order to reduce the interference of the test boards, the multiple DUT boards are separated separately, although it can effectively reduce the distance between DUTs. interference, but it also brings another problem. During the test, the DUT may be installed backwards when disassembling and assembling the test board, which will lead to the opposite result returned to the tester, that is, the results of DUT1 and DUT2 are exchanged, resulting in serious The quality is abnormal, which brings huge losses to the company. [0003] The above information disclosed in this...
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IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2822G01R31/2808G01R1/0408
Inventor 杨柳蒋思平袁俊郑朝生卢旭坤辜诗涛张亦锋
Owner 广东利扬芯片测试股份有限公司