The invention provides a testing method of a single
bus chip. The testing method includes the following steps; a first pin of a testing
host machine is connected to a first base pin of the
chip, a second pin of the testing
host machine is connected to a second base pin of the
chip, one of the first base pin and the second base pin is a data base pin, and the other is a grounding base pin; the first pin is arranged as a data output pin and outputs grounding signals, and the second pin is arranged as a
data input pin; after the chip is powered on, the testing
host machine reads the signals input by the second pin and judges whether the read signals are low level signals or not, if the read signals are the low level signals, the first pin is arrranged as the
data input pin, the second pin is set as the data output pin, outputs the grounding signals, and communication with the chip is carried out by the first pin; and if the read signals are not the low level signals, the communication with the chip is carried out by the second pin. According to the testing method, the testing host
machine can identify the base pins of the chip automatically, set the working
modes of the pins according to the conditions of the base pins and improve testing efficiency.