3results about How to "Guaranteed normal test" patented technology

The application relates to the field of testing and aims to solve the problem of low testing efficiency, and provides a display screen testing method, electronic equipment and computer storage medium. The display screen testing method is applied to electronic equipment including N display screens, N is an integer greater than or equal to 2, the method comprises the following steps: obtaining the testing configuration of a current testing scene; obtaining the multi-screen configuration attribute of the testing configuration, the multi-screen configuration attribute is used for indicating the target display screen to be tested in the current testing scene; determining M target display screens to be tested in the N display screens according to the multi-screen configuration attribute, M is an integer greater than or equal to 2, and M is less than or equal to N; obtaining the screen information of the M target display screens; controlling the M target display screens to display according to the screen information of the M target display screens; and applying corresponding stress to the displayed M target display screens according to the current testing scene. Two or more target display screens to be tested can be configured in the testing scene, and the testing efficiency is improved.

The application relates to the technical field of electronic component reliability test, in particular to a universal discrete structure optocoupler aging test circuit and a test method.The test circuit comprises the following: one end of an adjustable power supply VC is connected to the collector of a transistor in a to-be-tested optocoupler through a sampling resistor Rs; the other end is connected in series with an adjustable power supply VB and is connected to the emitter of the transistor through a feedback resistor R2; the series connection point COM of one end of the adjustable power supply VB and one end of the power supply VC is connected to the anode of a light-emitting diode in the to-be-tested optocoupler through a current-limiting resistor R1, and the other end is connected to the cathode of the light-emitting diode through the feedback resistor R2; a switch K is arranged between the feedback resistor R2 and the adjustable power supply VC.The test circuit can realize independent aging of the input and output parts of the optocoupler, can apply stress conditions most suitable for the specifications of the diode and the transistor respectively, the test result is more real and reliable, and a special test board does not need to be made for each type of optocoupler, so that the hardware cost and design complexity can be reduced.

The utility model relates to the technical field of magnetic core tube, especially to a magnetic core tube pressure resistance test structure, its including base, the oil guide hole is opened in the base, oil nozzle, oil nozzle sets up oil guide hole department, with oil guide hole intercommunication, connecting block, connecting block sets up the base, and connecting block sleeve sets up oil nozzle on, pressure block, pressure block sets up connecting block, and pressure block can be under the action with connecting block abuts, pressure block, connecting block with oil nozzle surround and form test space, the magnetic core tube of waiting for testing is sleeve set up oil nozzle, and floats in test space, the magnetic core tube pressure resistance test structure is configured as: hydraulic oil passes through oil guide hole and oil nozzle and enters to push the magnetic core tube movement and the pressure block abuts and carries out test. The utility model can avoid the deformation damage of magnetic core tube, and is convenient for subsequent assembly.