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14results about How to "Guaranteed normal test" patented technology
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Virtualized memory operation and maintenance test device
ActiveCN222337585UGuaranteed normal testTest does not affectDigital data processing detailsVirtual memoryVirtualization
The utility model discloses a virtualized memory operation and maintenance testing device which comprises a virtualized memory body, a testing assembly and a first auxiliary assembly are arranged on one side of the virtualized memory body, and through the arrangement of the testing assembly, a computer or a notebook computer can be placed in the operation and maintenance testing process of the virtualized memory. By arranging the first auxiliary component, the operation and maintenance test of the virtualized memory can be ensured, the storage can be carried out when the storage is not used, the placement of the virtualized memory body is not influenced, by arranging the first auxiliary component, the winding adjustment can be carried out on the test of the internal connection, so that the operation and maintenance test can be conveniently and better carried out, and by arranging the second auxiliary component, the operation and maintenance test efficiency is improved. According to the embodiment of the invention, heat dissipation can be carried out on the virtualized memory body in the operation and maintenance test process of the virtualized memory body, so that the operation and maintenance test of the virtualized memory body, namely the read-write speed of the virtualized memory body, can be prevented from being influenced.
Owner:SHANDONG YINHONG ELECTRONIC TECH CO LTD
PMSM motor controller hardware-in-the-loop test method
ActiveCN115309136BImprove debugging efficiencyGuaranteed normal testElectric testing/monitoringDatasheetElectric machinery
The invention discloses a PMSM motor controller hardware in-loop test method, S1, U, V, W three-phase temperature, adopts a table lookup method to obtain different temperatures; S2, the motor temperature adopts a voltage simulation method, and the voltage value at different temperatures is obtained by table lookup; S3, when the flux is debugged, a given fixed flux is added to obtain a table lookup flux, and it is displayed in a fixed two-fold relationship, so that a table lookup value can be obtained when a fixed value is given; S4, a one-dimensional array method is used to look up the table, and Ld is obtained by using Id to look up the one-dimensional data table, and Ld is obtained by using Iq to look up the one-dimensional data table; S5, a method in which the flux parameter and the inductance parameter fixed value and the table lookup value are selectable is adopted, and the parameter fixed method is first used for testing during the debugging process. The invention is conducive to improving the debugging efficiency of the controller.
Owner:CHONGQING TSINGSHAN IND
Display screen testing method, electronic device, and computer storage medium
ActiveCN119252157BGuarantee interception qualityshorten test timeStatic indicating devicesComputer hardwareInformation control
The application relates to the field of testing and aims to solve the problem of low testing efficiency, and provides a display screen testing method, electronic equipment and computer storage medium. The display screen testing method is applied to electronic equipment including N display screens, N is an integer greater than or equal to 2, the method comprises the following steps: obtaining the testing configuration of a current testing scene; obtaining the multi-screen configuration attribute of the testing configuration, the multi-screen configuration attribute is used for indicating the target display screen to be tested in the current testing scene; determining M target display screens to be tested in the N display screens according to the multi-screen configuration attribute, M is an integer greater than or equal to 2, and M is less than or equal to N; obtaining the screen information of the M target display screens; controlling the M target display screens to display according to the screen information of the M target display screens; and applying corresponding stress to the displayed M target display screens according to the current testing scene. Two or more target display screens to be tested can be configured in the testing scene, and the testing efficiency is improved.
Owner:HONOR DEVICE CO LTD
Universal discrete structure light coupling test circuit and test method
PendingCN122150726AReliable test resultsSimple and convenient operationElectrical testingBase element modificationsHemt circuitsControl theory
The application relates to the technical field of electronic component reliability test, in particular to a universal discrete structure optocoupler aging test circuit and a test method.The test circuit comprises the following: one end of an adjustable power supply VC is connected to the collector of a transistor in a to-be-tested optocoupler through a sampling resistor Rs; the other end is connected in series with an adjustable power supply VB and is connected to the emitter of the transistor through a feedback resistor R2; the series connection point COM of one end of the adjustable power supply VB and one end of the power supply VC is connected to the anode of a light-emitting diode in the to-be-tested optocoupler through a current-limiting resistor R1, and the other end is connected to the cathode of the light-emitting diode through the feedback resistor R2; a switch K is arranged between the feedback resistor R2 and the adjustable power supply VC.The test circuit can realize independent aging of the input and output parts of the optocoupler, can apply stress conditions most suitable for the specifications of the diode and the transistor respectively, the test result is more real and reliable, and a special test board does not need to be made for each type of optocoupler, so that the hardware cost and design complexity can be reduced.
Owner:XIAN TAI·E ELECTRONICS CO LTD
Gas replacement purification method and gas replacement purification device for system pipeline
The present invention discloses a gas replacement purification method and a gas replacement purification device for system pipelines, wherein the gas replacement purification method comprises: providing a system to be purified, introducing replacement gas into the system to be purified, and when the pressure in the system to be purified rises from the initial pressure P1 to the final pressure P2, stopping the introduction of replacement gas to exhaust and reduce the pressure of the system to be purified, so that the pressure in the system to be purified drops to the initial pressure P1, so as to complete a pulse replacement; repeating the above steps S101 to 103, so as to complete the pulse replacement for no less than n times. The present invention replaces the gas in the system by introducing replacement gas into the system to be purified, and replaces the gas in the system to be purified n times at the same time, thereby purifying the environment in the system. This method can realize efficient purification and replacement of complex system pipelines, further ensure the testing and operation safety of the FGSS system, especially the excellent replacement and purification effect of the "dead zone" inside the pipeline network.
Owner:JIANGNAN SHIPYARD (GRP) CO LTD
Magnetic core tube voltage withstanding test structure
The utility model relates to the technical field of magnetic core tube, especially to a magnetic core tube pressure resistance test structure, its including base, the oil guide hole is opened in the base, oil nozzle, oil nozzle sets up oil guide hole department, with oil guide hole intercommunication, connecting block, connecting block sets up the base, and connecting block sleeve sets up oil nozzle on, pressure block, pressure block sets up connecting block, and pressure block can be under the action with connecting block abuts, pressure block, connecting block with oil nozzle surround and form test space, the magnetic core tube of waiting for testing is sleeve set up oil nozzle, and floats in test space, the magnetic core tube pressure resistance test structure is configured as: hydraulic oil passes through oil guide hole and oil nozzle and enters to push the magnetic core tube movement and the pressure block abuts and carries out test. The utility model can avoid the deformation damage of magnetic core tube, and is convenient for subsequent assembly.
Owner:GUANGZHOU HUITONG PRECISION HYDRAULIC CO LTD
Device for testing operation performance of heat conduction oil
ActiveCN222394050Uconvenience to workreduce gapMaterial testing goodsStationary filtering element filtersTest performanceElectric machinery
The utility model discloses a conduction oil operation performance testing device which comprises a heating bin, one end of the heating bin is communicated with a circulation driving pipe, the bottom end of a waste residue bin is fixedly connected with supporting legs, the inner side of the waste residue bin is fixedly connected with a base plate, the inner side of the base plate is provided with a blocking part, and the blocking part is fixedly connected with the heating bin. When the first screen drum needs to be cleaned, the positions of the first screen drum and the second screen drum are exchanged under the action of the first motor, and then waste residues on the inner wall of the first screen drum are cleaned through the cleaning brush. The second screen drum can filter the heat-conducting oil normally during cleaning of waste residues on the inner side of the first screen drum, so that normal testing is guaranteed, the neutral period of the testing is shortened, the overall efficiency is improved, the waste residue bin or the heat-conducting oil of the whole device does not need to be discharged when the first screen drum or the second screen drum is cleaned, and the cost is reduced. And the work of workers is facilitated.
Owner:呼图壁县公共检验检测中心
Kernel driver test method and device, electronic equipment and storage medium
PendingCN119557202AGuaranteed normal testGuaranteed test resultsError detection/correctionInterprogram communicationTest efficiencyAlgorithm
The invention discloses a kernel driver test method and device, electronic equipment and a storage medium. The method comprises the steps that corpus seeds are obtained, the corpus seeds are added into a seed queue, and the corpus seeds are driving rules used for generating a kernel driving program; mutation operation is carried out on one or more corpus seeds in the seed queue, and mutation corpus seeds are generated; generating a test case by adopting the variation corpus seeds; and testing the kernel driver by executing the test case to obtain a test result of the kernel driver. According to the method and the device, the variation operation is performed on the driving rule serving as the corpus seed to generate the variation corpus seed, and the variation corpus seed is adopted to generate the test case, so that the kernel driving program is called to obtain the test result of the test case. According to the technical scheme, more corpus seeds are provided to generate more test cases through mutation operation on the corpus seeds, so that the kernel fuzzy test efficiency is improved, and the result after execution is ensured to a greater extent.
Owner:BEIJING CO WHEELS TECH CO LTD
Automobile exhaust emission filtering system for EMC experiment and EMC laboratory
The utility model provides a kind of automobile exhaust emission filtering system and EMC laboratory for EMC experiment, including interface, discharge pipeline, ventilation waveguide window and exhaust fan;Discharge pipeline includes rotating pipe section and fixed pipe section, fixed pipe section is arranged below rotary table, rotating pipe section is fixedly installed on rotary table, and can rotate relative to fixed pipe section under the drive of rotary table;Interface is installed in one end of rotating pipe section, and is correspondingly arranged at the tail gas exhaust port of experimental car, and the tail gas reaches outdoor after passing through ventilation waveguide window arranged in the side wall of shielding body under the action of exhaust fan.The utility model passes through the interface corresponding to the exhaust port of car, and is discharged to outdoor after passing through pipeline with rotary joint and ventilation waveguide window, and the overall system can adapt to EMC experimental scene with rotary table, can discharge in real time during experiment, ensure that the toxic gas and dangerous gas in clean electric wave darkroom are discharged, ensure normal test and personnel safety of vehicle.
Owner:ALBATROSS PROJECTS RADIOFREQUENCY TECH(SHANGHAI) CO LTD +1
Unhooking device for high-strain free drop hammer
ActiveCN222362535Uimprove securityImprove reliabilityFoundation testingFree fallingElectric machinery
Owner:CHINA WATER CONSERVANCY & HYDROPOWER NO 9 ENG BUREAU CO LTD
Automatic temperature control soaking device for waterproof material
ActiveCN222545205UGuaranteed normal testincrease water temperaturePermeability/surface area analysisTemperature controlWater temperature
The utility model discloses a waterproof material automatic temperature control soaking device which comprises a main body, a soaking cavity is formed in the upper side of the interior of the main body, a lifting seat is arranged above the main body, a water temperature sensor is further included and installed on the lower side of one side of the interior of the soaking cavity, and electric heating plates are installed on the two sides of the interior of the soaking cavity. A water soaking cavity is formed in the lower side of the interior of the main body, a coiled pipe is installed at the lower end of the interior of the water soaking cavity, a cooling cavity is formed in the lower side of the interior of the main body, the cooling cavity communicates with the coiled pipe through a water outlet pipe, the high-definition camera is installed in the middle of the lower end of the interior of the lifting base, and a bearing frame is arranged under the high-definition camera. And the bearing frame is connected with the lifting seat through two connecting plates. The automatic temperature control soaking device for the waterproof material ensures that the waterproof material is tested under the condition of constant water temperature, the accuracy and reliability of the test are improved, and the working efficiency is improved.
Owner:TAICANG CONSTR ENG QUALITY TESTING CENT CO LTD
Static load test device for pile foundation
The utility model provides a pile foundation static load test device, which relates to the technical field of pile foundations and comprises a steel plate, the top of the steel plate is connected with a hydraulic cylinder support, the top of the hydraulic cylinder support is provided with a round hole, a hydraulic cylinder telescopic rod is connected in the round hole in a penetrating manner, and the top of the hydraulic cylinder telescopic rod is connected with a hydraulic cylinder. The bottom of a telescopic rod of the hydraulic cylinder is connected with a hydraulic pressing disc, and a pile foundation is arranged at the bottom of the steel plate. According to the utility model, the hydraulic cylinder is started to enable the telescopic rod of the hydraulic cylinder to generate downward force to drive the hydraulic pressure plate to press the steel plate, and the bottom of the steel plate is connected with the pile foundation, so that the force generated by the hydraulic cylinder can be transmitted to the pile foundation through the steel plate, and the bearing capacity of the pile foundation can be accurately evaluated.
Owner:SUZHOU MINGCHENG ENG QUALITY INSPECTION CO LTD
A method for detecting power distribution of transformer
ActiveCN118519069Bachieve isolationImplement running testsTransformers testingPhotovoltaic energy generation
The invention discloses a power distribution detection method for a transformer, and relates to the technical field of power distribution testing of transformers. A water storage circulation box is fixed at the middle of the top of a total positioning plate, a bearing support plate is fixedly connected to the top of the water storage circulation box, a fixed sealing box is welded to the top of the bearing support plate, an expansion motor is symmetrically installed at one end of the fixed sealing box through a motor seat, an expansion sealing plate is clamped on the output shaft of the expansion motor, and the humidity, dryness, water volume, sand and dust and temperature in the environment are changed through a plurality of groups of different components, so that a variety of tests can be performed one by one on the same device, and a plurality of groups of different test cycles can be used in combination to further improve the test effect, solve the problem in the prior art that the test environment changes at a low speed and a variety of different test operations cannot be performed at the same time, increase the linkage between different tests, effectively improve the strength of the test, and thus ensure the accuracy of the test results.
Owner:SHANDONG UNIV OF TECH
Semiconductor structure and method for manufacturing the same
ActiveCN119153446BGuaranteed normal testSemiconductor/solid-state device detailsSolid-state devicesAntenna effectSemiconductor structure
The present invention relates to a semiconductor structure and a preparation method thereof, wherein the semiconductor structure comprises a substrate and a source structure, a gate structure, a protection structure, a discharge structure and a cutting path located on the substrate; the gate structure surrounds the source structure; the gate structure has a convex portion on one side facing the source structure; the protection structure surrounds the gate structure; the discharge structure surrounds the protection structure; the discharge structure comprises a connection layer, which is connected to the convex portion; and the cutting path surrounds the discharge structure. The discharge structure comprises a connection layer, which is connected to the convex portion, thereby forming a discharge loop, which does not occupy too much area of the structure, thereby eliminating the antenna effect of the gate structure during the preparation of the semiconductor structure. When the semiconductor structure is tested, it is only necessary to apply a voltage to the gate structure. Since the diode formed by the discharge structure is forward-conducted, the discharge structure is blown, and the discharge loop is cut off, thereby ensuring that the subsequent semiconductor structure can be tested normally.
Owner:GUANGZHOU YUEXIN PHASE III INTEGRATED CIRCUIT MANUFACTURING CO LTD