An infrared temperature measurement method without shields based on the detector temperature drift model

Abstract

The invention belongs to the technical field of infrared imaging temperature measurement, and in particular relates to an infrared temperature measurement method based on a detector temperature drift model. The close-distance extended source method is used for calibration, and the fitting curve method based on the law of infrared radiation is used in data processing. At the same time, in order to improve the measurement accuracy, segmental fitting is adopted, and a detector temperature drift model is proposed to eliminate environmental radiation, Influence of infrared detector target surface temperature on temperature measurement accuracy and stability. By placing the detector in a constant temperature box, adjusting the ambient temperature of the detector, obtaining blackbody images at different lens barrel temperatures and detector target surface temperatures, and establishing a lens barrel temperature-target surface temperature-gray scale change curve for each pixel. Then, the temperature of the black body was changed, and the source calibration was carried out at a short distance. According to the physical model, a non-shield infrared temperature measurement method based on the detector temperature drift model was proposed.

Description

Technical field [0001] The present invention belongs to the technical field of infrared imaging temperature, more particularly, to a method without flaps infrared temperature detector temperature drift based model. Background technique [0002] Nature of all the objects above absolute zero temperature, all the time the infrared radiation. Infrared temperature measurement is to use the heat radiating objects in the scene itself, infrared imaging target, and temperature display. With industry, agriculture, national defense, the development of medicine, more and more high temperature measurement requirements. The mechanical equipment, electrical equipment, production equipment, etc. In the case of the boot temperature measurement, without causing contamination of the product or damage to, the production process or a warehouse product temperature measurement growing demand situation next, as a non-contact infrared temperature measurement, non-destructive measurement of temperature me...

AI Technical Summary

Problems solved by technology

[0011] The current curve fitting method adopts global fitting, and the fitting error will be large for the region of interest and the scene with a relatively large temperature dynamic range, which seriously affects the improvement of temperature measurement accuracy

However, the look-up table method must establish enough sample points to obtain high accuracy. It is difficult to establish a sample database and takes a long time. Especially when the temperature measurement range is relatively wide, the calibration cycle will be very long and increase Factors such as the time cost and labor cost of actually producing the product

[0012] In order to reduce the impact of ambient temperature on image temperature measurement, shutters or baffles are often introduced in the existing technology, which undoubtedly occupies the space of the imaging system, making it difficult to design light and small mechanical structures of the imaging temperature measurement system, and also increases the imaging temperature. Circuit complexity of temperature measurement system

In addition, opening and closing the shutter block for a long time will not only cause a certain degree of wear on the surface of the detector, but also easily cause damage to the mechanical structure when used in a violent vibration environment

[0013] In order to reduce the influence of the target surface temperature of the infrared detector on the image temperature measurement, the existing technology often introduces temperature control circuits such as TEC, which will increase the power consumption of the instrument, especially in scenes with severe temperature changes, which will greatly increase the infrared temperature. The power consumption of the thermal imager restricts the practical application range of infrared temperature measurement, which is not conducive to the multi-field promotion of infrared temperature measurement

Images