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Online detection device for temperature stress accelerated aging of high-power LED whole lamp

An accelerated aging and detection device technology, applied in the field of LED detection, can solve the problems of inability to reflect the online aging of LED lamps, large measurement error of luminous flux maintenance rate, accelerated aging of high-power LED lamp temperature stress, etc.

Inactive Publication Date: 2020-12-08
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to propose a high-power LED whole lamp temperature stress accelerated aging online detection device, which solves the problem of large measurement errors in the maintenance rate of the whole light flux of high-power LED lamps in the prior art and cannot reflect the real process of online aging of LED lamps. problem; Realize online detection of accelerated aging of high-power LED lamp temperature stress

Method used

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  • Online detection device for temperature stress accelerated aging of high-power LED whole lamp
  • Online detection device for temperature stress accelerated aging of high-power LED whole lamp

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Embodiment Construction

[0033] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0034] See attached figure 1 And attached figure 2 , a high-power LED whole lamp temperature stress accelerated aging online detection device of the present invention at least includes:

[0035] Accelerated aging unit 1, the accelerated aging unit 1 at least includes a high and low temperature humid heat box 101 and a lamp picking device 103; the side wall of the high and low temperature humid heat box 101 has a test window 102 along the horizontal direction, and the lamp picking device 103 carries n groups of tested LED4 and drives it to rotate around the center of the lamp pick-up device 103, and each group of the tested LED4 and the lamp pick-up device 103 slide and cooperate along the horizontal direction; the test window 102 and the n groups of tested The circle of revolution of LED4 is arranged relatively; What this embodiment selects is the hig...

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Abstract

The invention discloses an online detection device for temperature stress accelerated aging of high-power LED whole lamp, belongs to the technical field of LED detection, and aims to solve problems that the measurement error of the whole lamp light flux maintenance rate of a high-power LED lamp is large, and the real process of online aging of the LED lamp cannot be reflected. The device at leastcomprises an accelerated aging unit, an optical detection unit, and a push transmission unit. The accelerated aging unit at least comprises a high-low temperature damp-heat box and a lamp pickup device; a test window in the horizontal direction is formed in the side wall of the high-low temperature damp-heat box, the lamp pickup device carries n sets of tested LEDs and drives the tested LEDs to rotate, and each set of tested LEDs is in sliding fit with the lamp pickup device in the horizontal direction. The test window and the rotary circumferences of the n sets of tested LEDs are oppositely arranged. The optical detection unit is communicated with the high-low temperature damp-heat box of the accelerated aging unit through the test window; and the push transmission unit pushes or pulls the set of tested LEDs which are rotated to the axis of the push-pull rod through the push-pull rod to enter or pull out of the optical detection unit through the test window.

Description

technical field [0001] The invention belongs to the technical field of LED detection, and in particular relates to an online detection device for temperature stress accelerated aging of a high-power LED whole lamp. Background technique [0002] Due to its low energy consumption, long life, light weight and other characteristics, LED lamps have increasingly become the mainstream lamps in the lighting market. The traditional method of LED life prediction requires at least 6000 hours of aging time, which consumes more time, manpower and energy. , so the industry uses a large number of temperature stress accelerated tests for LED lamps to improve detection efficiency. The power of common LED lighting products in the market is usually below 10 watts, and it can be considered as high-power LED lighting if it exceeds 10 watts. Common products include street lamps and lighting lamps. Whole lamp temperature stress accelerated aging test. [0003] Traditionally, two methods are used...

Claims

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Application Information

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IPC IPC(8): G01R31/44G01M11/02
CPCG01M11/02G01R31/003G01R31/44
Inventor 王潇洵王尧高群
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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