Static voltage drop repairing method, device and equipment and storage medium

Abstract

The invention provides a quiescent voltage drop repairing method, device and equipment and a storage medium, and relates to the technical field of integrated circuits. The method comprises the steps of obtaining a static voltage drop analysis result of an integrated circuit, wherein the voltage drop analysis result comprises a static voltage drop parameter of each circuit unit in the integrated circuit; obtaining a voltage drop violation unit in the integrated circuit according to the static voltage drop parameter of each circuit unit and the static voltage drop violation standard of the integrated circuit sign-off; determining a voltage drop violation reason of the voltage drop violation unit according to the layout information of the voltage drop violation unit in the integrated circuit;and according to the voltage drop violation reason, adopting a preset voltage drop repair strategy corresponding to the voltage drop violation reason to carry out layout and wiring adjustment on theintegrated circuit so as to repair the static voltage drop of the voltage drop violation unit. The static voltage drop and the circuit time sequence problem can be both considered, and the developmentand design progress of an integrated circuit is improved.

Description

Technical field[0001]The present invention relates to the technical field of integrated circuits, and in particular to a method, device, equipment and storage medium for restoring a static voltage drop.Background technique[0002]The voltage drop (Voltage (IR)-Drop, IR-Drop) of each circuit unit in an integrated circuit (IC) is too large, which is very important to the circuit performance and function, and stability of the entire integrated circuit.[0003]During the development and design of integrated circuits, it is particularly important to repair the voltage drop in the integrated circuit. However, in the current technology, it is only crudely to directly move the circuit unit that has a voltage drop violation to an area with a lower cell density. Moving the circuit unit in such a rough manner may cause a timing violation in the timing check of the timing path where the circuit unit is located in the integrated circuit.[0004]Therefore, the existing solutions cannot take into accoun...

AI Technical Summary

Problems solved by technology

[0004] Therefore, the existing solutions cannot take into account the voltage drop and the timing problem of the circuit, which seriously affects the development and design progress of the integrated circuit.

Images