Static voltage drop repair method, device, equipment and storage medium

Abstract

The present application provides a static voltage drop repair method, device, equipment and storage medium, which relate to the technical field of integrated circuits. The method includes: obtaining the static voltage drop analysis result of the integrated circuit, the voltage drop analysis result including the static voltage drop parameter of each circuit unit in the integrated circuit; according to the static voltage drop parameter of each circuit unit and the static voltage signed by the integrated circuit The voltage drop violates the standard, and the voltage drop violation unit in the integrated circuit is obtained; according to the layout information of the voltage drop violation unit in the integrated circuit, the cause of the voltage drop violation of the voltage drop violation unit is determined; according to the voltage drop violation reason, the preset voltage drop is used Violating the voltage drop repair strategy corresponding to the cause, adjusting the layout and wiring of the integrated circuit, so as to repair the static voltage drop of the voltage drop violation unit. The application can realize both static voltage drop and circuit sequence problems, and improve the development and design progress of integrated circuits.

Description

technical field [0001] The present invention relates to the technical field of integrated circuits, in particular to a static voltage drop repair method, device, equipment and storage medium. Background technique [0002] Excessive voltage drop (Voltage (IR)-Drop, IR-Drop) of each circuit unit in an integrated circuit (Integrated Circuit, IC) is critical to the circuit performance, function, and stability of the entire integrated circuit. [0003] In the development and design process of integrated circuits, it is particularly important to repair the voltage drop in integrated circuits. However, in the current technology, the circuit units with voltage drop violations are only roughly moved directly to an area with a lower unit density. Moving the circuit unit in such a rough manner may cause a timing violation in the timing check of the timing path where the circuit unit is located in the integrated circuit. [0004] Therefore, the existing solution cannot take into accou...

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Problems solved by technology

[0004] Therefore, the existing solutions cannot take into account the voltage drop and the timing problem of the circuit, which seriously affects the development and design progress of the integrated circuit.

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