Secondary impact preventing device of drop hammer impact testing machine and testing method of secondary impact preventing device

A technology of drop weight impact test and secondary impact, which is applied in the field of drop weight impact test equipment and anti-secondary impact device of drop weight impact testing machine, which can solve the problems of inability to maintain experimental accuracy, secondary impact damage of specimens, and too late Push out and other issues to achieve the effect of easy experimental mechanism, accurate capture, and avoidance of further damage
CN112198069APending Publication Date: 2021-01-08KUNMING UNIV OF SCI & TECH
0 Cites 5 Cited by

Patent Information

Authority / Receiving Office
CN ยท China
Current Assignee / Owner
KUNMING UNIV OF SCI & TECH
Publication Date
2021-01-08

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention relates to a secondary impact preventing device of a drop hammer impact testing machine and a testing method of the secondary impact preventing device, and belongs to the technical fieldof engineering experiment equipment. The secondary impact preventing device comprises a top plate, a base, supporting rods, guide rods and a sliding plate, wherein an electromagnetic capturing and lifting device is arranged under the top plate; an objective table is mounted on the base, and a cushion block is mounted on the objective table; supporting rods are fixed to the periphery of the base,guide rods are installed in the middles of the supporting rods, and the upper portions of the supporting rods and the guide rods are fixed to the top plate; the two ends of the sliding plate are installed on the guide rods, the balance weight chamber is installed under the sliding plate, a hammer base is installed under the balance weight chamber, and a drop hammer is installed under the hammer base; a fixing rod is installed in the center of the counterweight chamber; and an infrared emitter I, an infrared emitter II, an optical sensor I and an optical sensor II which are level with the top part of a sample are mounted at the lower ends of the four supporting rods respectively. By means of electromagnetic capture and lifting, the possibility of secondary impact is effectively reduced, operation is convenient, the structure is simple, and impact tests of different types of hammer heads can be conducted on samples of various test specifications.
Need to check novelty before this filing date? Find Prior Art

Description

Technical field

[0001] The invention relates to a secondary impact prevention device for a drop hammer impact tester and a test method thereof, in particular to a device suitable for drop hammer impact experiments in geotechnical engineering, mining engineering, and civil engineering, belonging to the technical field of engineering experimental equipment .Background technique

[0002] In the rock dynamics experiment, the drop hammer impact testing machine is used to conduct one or more pre-impact experiments on the rock sample, and then analyze and study the damage and failure of the rock sample under different times of pre-impact, and the impact of the rock under different damage conditions The study of static and dynamic characteristics is of great significance.

[0003] The principle of the falling weight impact testing machine is to raise the falling weight to the required height to increase the weight of the falling weight, release the falling weight to make a free fall motion, make it i...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More