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Reference voltage determination method and device

A reference voltage and determination method technology, applied in the direction of measuring devices, measuring current/voltage, measuring electrical variables, etc., can solve problems such as data reading errors, and achieve the effect of ensuring normal use and ensuring accuracy

Pending Publication Date: 2021-01-19
INNOGRIT TECH CO LTD
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Problems solved by technology

[0002] Solid-state drives (SSDs) use NAND (AND) flash memory particles as storage media for data storage. Among them, NAND memory is composed of multiple storage units. Usually, the reference voltage configured when the SSD leaves the factory can be added to the storage unit to read the data stored in the storage. However, in practical applications, due to reasons such as NAND read and write operations, erase and write operations, data retention time, usage time, etc., the actual reference voltage corresponding to each data state will be different from the factory configured reference voltage. offset, this phenomenon may lead to data reading errors

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  • Reference voltage determination method and device
  • Reference voltage determination method and device

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Embodiment Construction

[0064] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0065] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0066] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

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Abstract

The invention relates to a reference voltage determination method and device. The method comprises the steps: reading the data of a first flash memory page through employing a plurality of different reference voltages, and enabling the reference voltage, with the first error bit number reaching a convergence value, of the read data to serve as a first target reference voltage, wherein the first flash memory page is any one of a plurality of flash memory pages of a flash memory block to be tested; adjusting the first target reference voltage to obtain a plurality of second target reference voltages; reading data of a plurality of flash memory pages of the flash memory block by utilizing the plurality of second target reference voltages, and taking the second target reference voltage with the smallest second error bit number of the read data as the target reference voltage. Through the method, the current real reference voltage of the flash memory block can be determined, so that the normal use of the flash memory block is ensured, and the accuracy of data reading is ensured.

Description

technical field [0001] The present disclosure relates to the technical field of integrated circuits, in particular to a method and device for determining a reference voltage. Background technique [0002] Solid-state drives (SSDs) use NAND (AND) flash memory particles as storage media for data storage. Among them, NAND memory is composed of multiple storage units. Usually, the reference voltage configured when the SSD leaves the factory can be added to the storage unit to read the data stored in the storage. However, in practical applications, due to reasons such as NAND read and write operations, erase and write operations, data retention time, usage time, etc., the actual reference voltage corresponding to each data state will be different from the factory configured reference voltage. offset, this phenomenon may cause data reading errors. Contents of the invention [0003] In view of this, the present disclosure proposes a method for determining a reference voltage, th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/30G11C5/14
CPCG11C16/30G11C5/147G11C11/5642G11C2211/5634G11C7/14G11C16/26G11C29/028G11C29/021G11C16/28G11C16/34G01R19/16566
Inventor 魏韬冯正田魏柯
Owner INNOGRIT TECH CO LTD
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