A kind of automatic test system and test method of apd-tia ROSA
An automatic test system and automatic test technology, applied in the field of optical communication, can solve the problems of inability to achieve precise adjustment, low accuracy of manual testing, and increase the difficulty of testing, and achieve the effects of high testing efficiency, simplified structure and convenient operation.
Active Publication Date: 2021-06-11
XIAMEN SAN U OPTRONICS
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Problems solved by technology
[0005] However, at present, the above-mentioned APD-TIA ROSA with a built-in TEC is mostly tested manually, which will increase the difficulty of the test and lower work efficiency. Every time the TEC’s applied current parameters are adjusted, it is necessary to observe the resistance of the thermistor. Value, repeated manual adjustment and observation until the resistance value reaches the specified value; on the other hand, the accuracy of manual testing is low
Experiments show that when manually adjusting the TEC current parameters, adjusting 10mA, the resistance value of the thermistor changes by more than 1kΩ, adjusting 1mA, the resistance value changes by more than 0.1kΩ, adjusting 0.1mA, the wavelength changes by more than 0.01kΩ, and precise adjustment cannot be achieved
Method used
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Embodiment 1
[0048] refer to figure 1 As shown, the present invention provides an APD-TIA ROSA automatic test system, which includes: a fixture, a test board assembly, an optical input unit, a measurement and control unit, and a computer unit. Among them, the APD-TIA ROSA to be tested has a built-in TEC and a thermistor. Under the action of an applied current, the TEC can switch between cooling and heating modes. The resistance of the thermistor changes with the change of temperature (the resistance of the thermistor The value and temperature have a linear relationship), and the thermistor is installed next to the APD-TIA, so that the temperature of the APD-TIAROSA to be tested can be indirectly characterized. The fixture has a sealed cavity, which is used to accommodate the APD-TIA ROSA to be tested and provide different external temperature environments for the APD-TIA ROSA to be tested; the test board assembly is fixedly installed in the sealed cavity, It is electrically connected with...
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The invention discloses an automatic testing system and testing method of APD-TIA ROSA, which comprises an APD-TIA ROSA to be tested with a built-in TEC and a thermistor, and an optical input for providing an optical signal for the APD-TIA ROSA to be tested unit, measurement and control unit for power supply and optoelectronic parameter testing of the APD‑TIA ROSA to be tested, and a computer unit for monitoring the measurement and control unit. The automatic test system provided by the invention realizes the automatic adjustment of the TEC inside the APD-TIA ROSA to be tested under different temperature external environments through the computer unit and the measurement and control unit, and outputs the photoelectric parameter test results of the APD-TIA ROSA to be tested through the measurement and control unit, The output results of the measurement and control unit are monitored and recorded by the computer unit. By fixing the resistance value of the thermistor within a certain range, it is ensured that the TEC will automatically adjust under different external temperatures (normal temperature, high temperature or low temperature) so that the APD‑TIA ROSA to be tested can be adjusted automatically. The temperature remains constant, the system is easy to operate, has high accuracy, and has high test efficiency.
Description
technical field [0001] The invention relates to the technical field of optical communication, in particular to an APD-TIA ROSA automatic test system and a test method. Background technique [0002] APD-TIA ROSA is a kind of ROSA (Receiver Optical Sub-Assembl, optical receiving device / component) commonly used in the field of optical communication, in which APD (Avalanche Photodiode Detecor) is an avalanche photodiode, which can make the original signal light by using the avalanche multiplication effect The current is multiplied, thereby increasing the light receiving sensitivity of ROSA; TIA (Trans-Impedance Amplifier) is a pre-transimpedance amplifier. In APD-TIA ROSA, APD and TIA are connected in series, and the weak signal current generated by APD receiving light is passed through TIA Converted into a signal voltage output with sufficient amplitude. [0003] In the absence of light, there is also a weak current in the photodiode. These currents are generated under the a...
Claims
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IPC IPC(8): G01R31/26G01M11/02
CPCG01M11/02G01R31/2601G01R31/2635
Inventor 曾延华余金文林炳灿王锐陈威翔蓝斌伟
Owner XIAMEN SAN U OPTRONICS