Port Equivalent Parallel Analysis Method and System for System Level Integrated Circuit DC Voltage Drop

Abstract

The invention discloses a port equivalent parallel analysis method and system for DC voltage drop of system-level integrated circuits. The system-level ultra-large-scale integrated circuit is split into multiple subsystems in units of layers, and the multiple subsystems are parallelized by using coarse particles. Analysis, each coarse particle independently generates the sparse matrix equations of each subsystem and uses the star-delta transformation method to eliminate its internal nodes to form the multi-port network impedance matrix of each subsystem, and uses coarse particles to merge in parallel to form a super large-scale integration The overall multi-port network impedance matrix of the circuit; when analyzing a subsystem in detail, replace the multi-port network impedance matrix of the subsystem with its finite element sparse matrix to form a system of equations for solving the potential field of the subsystem, and then analyze the current subsystem DC voltage drop and current density distribution. On the basis of ensuring the solution accuracy, the invention improves the solution speed and realizes fast and accurate analysis of the DC voltage drop of the system-level VLSI.

Description

technical field [0001] The invention relates to the field of system-level integrated circuits, in particular to a port equivalent parallel analysis method and system for DC voltage drop of system-level integrated circuits. Background technique [0002] The DC voltage drop analysis of system-level VLSI is an important task in the back-end verification of integrated circuits. In the design process of the current system-level VLSI, the core power supply voltage of the devices in the integrated circuit continues to decrease, and the tolerance of the allowable voltage is getting smaller and smaller, but the operating current and wiring density of the integrated circuit are getting larger and larger. As a result, the DC voltage drop problem has become increasingly prominent. If the DC voltage drop problem is not considered in the design process of the system-level VLSI, it is likely that the noise margin of the system will decrease due to the DC voltage drop problem, and a small ...

AI Technical Summary

Problems solved by technology

For system-level VLSI with multi-scale structure, if high-quality meshing is directly performed on the area where the entire system-level VLSI is located, the number of grid nodes generated will reach tens of millions or even hundreds of millions. It is almost impossible to directly solve the tens of millions or even hundreds of millions of finite element sparse matrices formed by the grid. Even if it can be solved, it will require huge memory and CPU time. For the design of system-level VLSI For this reason, the calculation cost and time cost are too high, so it is necessary to find a faster solution without loss of accuracy, and quickly and accurately analyze the DC voltage drop of the system-level VLSI

Images