A puncture force measurement device and measurement method based on the principle of laser speckle interference
A technology of laser speckle and measuring device, which is applied in the directions of measuring device, measuring force, puncture needle, etc., can solve the problems of inability to accurately obtain the force condition close to the puncture tip, large interference factors of the tip puncture force, and low precision, etc. The effect of information loss, low measurement environment requirements, and high accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0047] In order to further understand the invention content, characteristics and effects of the present invention, the following examples are given, and detailed descriptions are as follows in conjunction with the accompanying drawings:
[0048] as attached Figure 1 to Figure 3 As shown, a puncture force measurement device based on the principle of laser speckle interference includes a housing, a needle insertion unit, a laser irradiation unit and a camera unit.
[0049] (1) Shell
[0050] The outer shell includes an outer protective sheath 1 and an inner soft sleeve 2 , and the inner soft sheath 2 is arranged inside the outer protective sheath 1 . The outer protective sheath 1 is provided with a needle outlet duct 3, a lighting duct and a camera duct, the needle outlet duct 3, the lighting duct and the camera duct are arranged side by side in the longitudinal direction, and arranged in a triangular shape in the transverse direction. The needle pipeline 3 is located at the ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com