Device and method for checking for surface defect, using image sensor

Abstract

The present invention relates to a device and method for checking for a surface defect, using an image sensor, and can increase accuracy in detecting defects of various types, shapes, or directions, and comprise: a frame part for providing a transport path of an object to be checked, along the lengthwise direction parallel to the ground surface; a transport part provided on one side of the frame part so as to transport the object to be checked, along the transport path; an image sensor part provided in the middle of the transport path so as to capture an image of the surface of the object to be checked, from above the transported object to be checked; a lighting part provided in the middle of the transport path and comprising a plurality of lighting lamps for radiating lights in differentdirections to each other with respect to an image capturing area, which is an area of the surface of the object to be checked and the image of which is captured by the image sensor part; and a controlpart which controls the operation of the transport part and the image sensor part so that the image capturing area is only moved by a unit transport distance each time an image is captured, by movingthe object to be checked by the preset unit distance and capturing an image of the surface of the object to checked.

Description

technical field [0001] The present invention relates to a surface defect inspection device and inspection method using an image sensor. More specifically, the surface defect inspection device and inspection method using an image sensor are configured to use an image sensor to inspect an object while transporting it. The surface of the object is photographed to obtain a scanning image that scans the entire surface of the subject, and one of the plurality of illuminating lamps with different light irradiation directions is turned on in a predetermined order for each imaging. The imaging area captured by the image sensor is irradiated with light, so that the above-mentioned scanned images for each of the plurality of lighting lamps with different light irradiation directions can be obtained with only one scan, so that not only can improve The detection accuracy of defects in the direction can be improved, and the time required for the surface inspection of the object can be signi...

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Problems solved by technology

[0007] However, in the case of Korean Patent No. 10-0470402, due to the limitation of the arrangement structure of the line-type light source, light can only be irradiated from two directions, the front and the rear, for the scanning line of the line-scanning image sensor. There is still a disadvantage that there is a problem with the prior art that it is difficult to accurately detect all surface defects with various types, shapes or orientations

[0008] In addition, in the case of the following Korean Patent No. 10-0470402, since a line-scanning image sensor is used, not only the scanning speed is slow, but also scanning is repeated while alternately flashing two light sources for each scanning line. Therefore, in the above method, there is a problem that it takes too much time to inspect the entire surface of the object to be inspected, and when the area of ​​the object to be inspected is large, such as a secondary battery for an electric vehicle, a comprehensive inspection is required in terms of product characteristics. , has the disadvantage that this problem is further exacerbated by

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