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Simple method for determining IC faults

A simple, trouble-free technique used in electronic circuit testing, measuring devices, instruments, etc.

Pending Publication Date: 2021-03-12
海博瑞电子(江苏)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Aiming at the deficiencies in the prior art, the present invention provides a simple method for judging IC faults, so that the diodes can clamp the function pins, and the input / output voltage is controlled at 0~(VCC-the forward conduction voltage of the diode ), so that the IC pins are not easy to be overvoltage and burned. This method is simple to operate and low in cost, and it is convenient for ordinary maintenance personnel to carry out follow-up work.

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  • Simple method for determining IC faults

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0035] A simple method for judging IC failure, the production method comprises the following steps:

[0036] Step 1: Using the diode clamp circuit inside the IC, we can directly use a commonly used digital multimeter to simply determine whether the IC function pin is damaged;

[0037] Step 2: There is a reverse diode connected between the pin and the ground, and a diode connected between the pin and the power supply, then we can use this protection tube to mak...

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Abstract

The invention relates to the field of IC fault judgment and discloses a simple method for judging IC faults. The method comprises the following steps that: 1, whether IC function pins are damaged or not is simply judged by directly utilizing a common digital multimeter through utilizing a diode clamping circuit in an IC; and 2, a backward diode is connected between a pin and the ground, and a diode is connected between the pin and a power supply, so that the protection tube can be used for simple judgment. According to the simple method for judging the IC faults, the diode has a clamping function on the functional pin, the input / output voltage is controlled to be 0-(the forward conduction voltage of a VCC-diode), so that the IC pin is not prone to overvoltage burning. The method is easy tooperate, low in cost and convenient for common maintenance personnel to carry out follow-up work.

Description

technical field [0001] The invention relates to the field of IC fault judgment, in particular to a simple method for judging IC faults. Background technique [0002] With the increasing integration of circuit boards, there are more and more various dedicated chips (ICs), and the integrated functions are becoming more and more powerful. In order to protect the pins of the IC from being damaged by static electricity, usually at the beginning of IC design, an anti-static diode protection circuit will be introduced on the output function pins. Once the current electronic products fail, the commonly used IC fault judgment methods are as follows : [0003] 1. Maintenance personnel usually use an oscilloscope to measure the electrical signal of each pin of the IC after powering on the device, and judge whether the IC is faulty according to whether the waveform displayed by the oscilloscope is consistent with the designed waveform. This is a more scientific way of judging. [000...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/27G01R31/26
CPCG01R31/2632G01R31/275G01R31/2851G01R31/2887
Inventor 李清
Owner 海博瑞电子(江苏)有限公司
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