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A pulsed ionization mass spectrometer and analysis method

A chemical mass spectrometer and ion analysis technology, applied in the field of using pulsed photoionization ionization mass spectrometer and its analysis, can solve problems such as ultraviolet lamp interference, and achieve the effect of reducing noise

Active Publication Date: 2021-09-28
深圳至秦仪器有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] In order to solve the technical problem of interference caused by the continuous irradiation of ultraviolet lamps in the above-mentioned prior art, the present invention proposes a pulsed ionization mass spectrometer and analysis method

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  • A pulsed ionization mass spectrometer and analysis method
  • A pulsed ionization mass spectrometer and analysis method
  • A pulsed ionization mass spectrometer and analysis method

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Embodiment Construction

[0030] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention, the present invention will be described in further detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely intended to illustrate the invention and are not intended to limit the invention.

[0031] In the description of the invention, it is to be understood that the term "center", "length", "width", "thickness", "upper", "lower", "before", "post", "left", " Right "," vertical "," horizontal "," top "," bottom "," inside "," outside ", etc., is based on the orientation or positional relationship shown by the drawings, just for easy convenience The invention and simplified description are described, rather than indicating or implying that the device or element must have a specific orientation, and is constructed and operated in a particular orientation, and th...

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Abstract

The invention discloses a pulsed ionization mass spectrometer and an analysis method, comprising: a vacuum chamber, an ultraviolet lamp installed in the vacuum chamber and an ion analyzer module with an ionization area, the irradiation direction of the ultraviolet lamp is toward the In the ionization area of ​​the ion analyzer module, a switchable light source control module is arranged between the ultraviolet lamp and the ionization area. Turning off the light source control module can interrupt or weaken the light emitted by the ultraviolet lamp to the ionization area. The present invention can generate discontinuous pulsed ionization by controlling the opening and closing of the light source control module, so that the ionization is only carried out in the ionization stage, reducing the defects of insufficient ion cooling caused by continuous ionization or still generating ions in the scanning stage, and Reduce the noise generated by the UV light electronics during the scanning phase and improve the measurement accuracy.

Description

Technical field [0001] The present invention relates to the detection of material component analysis using mass spectrometry, and more particularly to a pulsed photore ionized mass spectrometry and its analysis. Background technique [0002] The mass spectrometer is an instrument for substance qualitative analysis of the material to separate the material to ions by electrically ionization ions, and then separate the ions by electromagnetic field. With the continuous development of mass spectrometry, and the continuous increase in the in-situ detection demand is increasing, small mass spectrometry studies can be achieved. The mass spectrometer core components include ionization sources, analyzers, and detection devices. Among them, the ion trap analyzer is considered to be a material spectrum miniaturized ideal analyzer because of the small structure, and the use of different ion sources can meet different application needs. [0003] Among the various ion sources, the vacuum ultra...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/16H01J49/00H01J49/02
CPCH01J49/0031H01J49/02H01J49/161
Inventor 鲁信琼谭祖正何佳成
Owner 深圳至秦仪器有限公司