Material characteristic testing equipment
A technology for testing equipment and material properties, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as difficult to test the performance of SMA memory alloys
Pending Publication Date: 2021-04-20
武汉天拓宇航智能装备有限公司
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Problems solved by technology
[0004] The main purpose of the present invention is to provide a kind of material property test equipment, to solve the problem that it is difficult to test the performance of the SMA memory alloy under complex environment in the prior art
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[0021] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0022] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.
[0023] It should be noted that the terms "first...
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The invention provides material characteristic testing equipment. The embodiment of the material characteristic testing equipment comprises a temperature adjusting box, a tension generating assembly and a testing assembly. A test space is formed in the temperature adjusting box, temperature adjusting equipment is arranged in the temperature adjusting box, and a first clamp and a second clamp are installed in the test space. The tension generating assembly is connected with the second clamp and used for driving the second clamp to move to generate tension, and the testing assembly is connected with the second clamp. According to the technical scheme, the first clamp and the second clamp for testing are placed in the test space of the temperature adjusting box, and the temperature adjusting equipment is arranged in the temperature adjusting box, so that the temperature of the test space can be effectively adjusted, the performance of a to-be-tested material piece at different temperatures can be tested, and the performance test dimension of the test material piece in a complex environment is increased.
Description
technical field [0001] The invention relates to the technical field of test and measurement equipment, in particular, to a material property test equipment. Background technique [0002] Due to its shape memory effect and pseudoelasticity, SMA memory alloys have been widely used in many fields such as aerospace, mechatronics, biomedicine and daily life. As a new class of functional materials, many properties have been developed and utilized, such as low-temperature fittings in aircraft hydraulic systems, antennas for spacecraft, brackets in human cavity, temperature-controlled springs, etc. Even so, the place where SMA memory alloy can be developed and applied is far more than that, and it has many characteristics waiting to be discovered and applied. [0003] However, at present, for the research on the characteristics of SMA memory alloy materials, there are only equipment that simply test the mechanical properties of SMA memory alloy materials, or equipment that can only...
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IPC IPC(8): G01N3/18G01R31/00
Inventor 邵兵许冶万建武涂克恒张荣茹陆一凡李雷
Owner 武汉天拓宇航智能装备有限公司