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Test circuit

A technology for testing circuits and capacitors, which is applied in the direction of measuring electricity, measuring electrical variables, and digital circuit testing, and can solve problems such as the influence of variable resistance quality.

Pending Publication Date: 2021-05-04
NUVOTON
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, existing test results will be affected by the quality of the varistor

Method used

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Embodiment Construction

[0026] In order to make the purpose, features and advantages of the present invention more comprehensible, the following specifically cites the embodiments, together with the accompanying drawings, for a detailed description. The description of the present invention provides different examples to illustrate the technical features of different implementations of the present invention. Wherein, the configuration of each element in the embodiment is for illustration, not for limiting the present invention. In addition, the partial repetition of the symbols in the figures in the embodiments is for the purpose of simplifying the description, and does not imply the correlation between different embodiments.

[0027] figure 1 It is a schematic diagram of the test system of the present invention. Such as figure 1 As shown, the test system 100 includes a microcontroller (microcontroller) 110 and a test circuit 120 . The microcontroller 110 has a logic circuit 111 . In a normal mod...

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Abstract

A test circuit is used for testing the oscillation capability of a microcontroller, is independent of the microcontroller, and comprises an input end, an output end, a first capacitor, an oscillator and a resistor. The input end is used for receiving a driving signal generated by the microcontroller. The output end is used for outputting a feedback signal to the microcontroller. The first capacitor is coupled to the input terminal. The oscillator is coupled to the first capacitor and receives the driving signal. The resistor has a fixed resistance value and is coupled between the oscillator and a second capacitor. The second capacitor provides a feedback signal. The capacitance values of the first capacitor and the second capacitor are adjustable.

Description

technical field [0001] The present invention relates to a test circuit, in particular to a test circuit for testing the oscillation capability of a micro-control circuit. Background technique [0002] Generally speaking, before the microcontroller leaves the factory, it needs to undergo an oscillation test to determine whether the microcontroller can output a normal frequency. In the existing testing method, an oscillator and a variable resistor are connected in series at the frequency input terminal of the microcontroller, and then the resistance value of the variable resistor is manually adjusted by a tester. However, manual adjustment takes a lot of test time and is not suitable for mass production testing. Furthermore, the initial dynamic resistance of the variable resistor varies considerably. Therefore, existing test results will be affected by the quality of the varistor. Contents of the invention [0003] The invention provides a test circuit for testing the osc...

Claims

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Application Information

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IPC IPC(8): G01R31/317
CPCG01R31/31724
Inventor 洪嘉宏
Owner NUVOTON