Straightness interference measuring device insensitive to incident angle

A technology of interferometric measurement and straightness, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of increased squareness measurement error, large difference in straightness slope, and reduced data reliability.

Active Publication Date: 2021-05-11
CHOTEST TECH INC
View PDF13 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The interference mirror of the existing straightness mirror group is relatively sensitive to the incident angle, and a small change in the incident angle can cause a large change in the beam splitting angle of the interferometer, resulting in a large difference in the straightness slope measured at different incident angles. It is difficult to guarantee the repeatability of the straightness measurement. Although the slope can be eliminated in the straightness measurement, when it is applied to the squareness measurement, the difference in the slope will be directly reflected in the squareness measurement error, resulting in an increase in the squareness measurement error and reliable data. decreased sex
[0006]2. The existing straightness interferometric measurement device has the problem of measurement blind area

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Straightness interference measuring device insensitive to incident angle
  • Straightness interference measuring device insensitive to incident angle
  • Straightness interference measuring device insensitive to incident angle

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The present invention will be further described below in conjunction with the description of the drawings and specific embodiments.

[0024] Such as Figure 1 to Figure 7 As shown, a straightness interferometric device that is insensitive to incident angle mainly includes an interferometer host system 1 , a double Wollaston prism 2 and a double-sided rectangular roof reflector 3 . The interferometer host system 1 emits a measuring beam, which is divided into two beams of orthogonally polarized light after passing through the double Wollaston prism 2, and returns to the detection and receiving unit 4 in the interferometer host system 1 after being reflected by the double-sided right-angle roof reflector 3 Analyze the interference signal and get the relative distance information. By moving the double Wollaston prism, the relative distance information of different points on the linear guide is obtained, and finally the straightness error of the linear guide is calculated....

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a straightness interference measuring device insensitive to an incident angle. The device comprises an interferometer host system, a double Wollaston prism, a double-sided right-angle roof reflector and a detection receiving unit, the interferometer host system comprises a laser emission optical system, the laser emission optical system emits a measuring light beam, after passing through the double Wollaston prism, the light is divided into two beams of cross-polarized light, and the light is reflected by the double-sided right-angle roof ridge reflector and then returns to the detection receiving unit for analysis of interference signals, and relative distance information is obtained. The device has the beneficial effects that the double Wollaston prism is adopted as the straightness interference mirror, so that the incident light angle is not sensitive, and the measurement precision can be obviously improved especially in the verticality measurement application; a parallel light beam polarization element with the adjustable shearing difference is adopted, and the problem that an existing straightness interference measurement device has a measurement blind area can be solved.

Description

technical field [0001] The invention relates to a straightness interferometric device, in particular to a straightness interferometric device insensitive to incident angles. Background technique [0002] British patent 1409339 mentions a linearity interferometric device, which uses a single Wollaston prism to divide the laser beam along the optical axis into two laser beams whose vibration directions are orthogonal. The beams of the two laser beams are approximately symmetrical about the main optical axis. The two beams travel to the double-sided mirror and return to the original path, and recombine into one beam at the Wollaston prism, and return to the system along the main optical axis. The angle of the double-sided mirror is designed to match the beam splitting angle of the Wollaston prism. This system has obvious shortcomings. One is that the beam returns to the original path, which easily leads to an imbalance in the laser frequency stabilization, resulting in a decre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/26
CPCG01B11/26Y02A90/10
Inventor 冯福荣张琥杰张和君陈源
Owner CHOTEST TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products