Test data acquisition method, device and apparatus and computer storage medium
A technology of test data and collection method, applied in the direction of fault hardware test method, detection of faulty computer hardware, calculation, etc., can solve the problems of low test efficiency and complicated test process operation, so as to save the labor cost of the production line and improve the test The effect of efficiency
Pending Publication Date: 2021-05-25
FATRI XIAN TESTING & CONTROL TECH CO LTD
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[0005] The embodiment of the present invention provides a test data collection method, device, equipment and computer storage medium, which can solve the problems of complex operation and low test efficiency in the existing test process
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[0044] The characteristics and exemplary embodiments of various aspects of the present invention will be described in detail below. In order to make the purpose, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described here are only intended to explain the present invention rather than limit the present invention. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is only to provide a better understanding of the present invention by showing examples of the present invention.
[0045] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operati...
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The invention discloses a test data acquisition method, device and apparatus and a computer storage medium. The method is applied to a data test device, the data test device is connected with a test generation device and a to-be-tested device, the test generation device is connected with the to-be-tested device, and the method comprises the steps of generating multiple test instructions of the to-be-tested device, wherein the multiple test instructions correspond to multiple to-be-tested functions of the to-be-tested device; sending the plurality of test instructions to the test generation device, so that the test generation device generates test control information for testing according to the test instructions, and the to-be-tested device generates a test value; acquiring a test value generated by the to-be-tested device according to each piece of test control information; and generating a test report of the to-be-tested device according to the test value of each to-be-tested function and a preset value. According to the embodiment of the invention, the problems of complex operation in the existing test process and low test efficiency can be solved.
Description
technical field [0001] The invention belongs to the technical field of automated testing, and in particular relates to a test data collection method, device, equipment and computer storage medium. Background technique [0002] In recent years, with the rapid development of science and technology, the rapid development of data acquisition systems has led to a growing demand for functional testing of equipment during equipment production or equipment repair. [0003] At present, for the functional test method of the data acquisition system, testers test the various functions of the equipment that need functional testing one by one. During the testing process, it is necessary to provide standard excitation signals with the help of expensive waveform generators or to connect specific sensors. Target inputs are provided and even other test aids need to be connected. This testing method is not only complicated and error-prone, but also requires testers to have a very detailed und...
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IPC IPC(8): G06F11/22G06F11/26
CPCG06F11/2205G06F11/2268G06F11/2273G06F11/26
Inventor 聂泳忠杜琴李红星王晟黄为森
Owner FATRI XIAN TESTING & CONTROL TECH CO LTD