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Refined particulate matter source analysis method

A technology for refining particles and analysis methods, applied in the field of particle source analysis, which can solve problems such as inaccurate source analysis results, difficulty in emission sources, and increasing models.

Pending Publication Date: 2021-05-28
NANKAI UNIV
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Problems solved by technology

[0002] Most of the existing atmospheric particulate matter source apportionment methods only use inorganic elements, ions and elemental carbon components for particulate matter source apportionment. difficulty
[0003] There are many types of organic compounds involved in existing studies, but the identification and screening of organic compounds have not been further identified and screened when using them for source apportionment. When a large number of organic compounds and a small amount of If a large amount of organic matter is directly included in the model, it will increase the uncertainty of the model, resulting in inaccurate source apportionment results

Method used

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Embodiment Construction

[0050] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.

[0051] Such as figure 1 , in the embodiment of the present application, the present invention provides a fine particulate source analysis method, the method includes the steps:

[0052] S1: Obtain the emission characteristics of organic matter from each characteristic emission source;

[0053] In the embodiment of the present application, the acquisition of the organic matter emission characteristics of each characteris...

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Abstract

The invention discloses a refined particulate matter source analysis method. The method comprises the steps of acquiring organic matter emission characteristics of each characteristic emission source; collecting a particulate matter sample; analyzing the organic matter time change rule of the particulate matter sample; performing primary component screening on the particulate matter sample according to the organic matter emission characteristics and the organic matter time change rule; calculating correlation coefficients among the components in the particulate matter sample after the first-time component screening; performing secondary component screening on the particulate matter sample subjected to the primary component screening according to the correlation coefficients; and according to a factor analysis model, carrying out source type identification on the particulate matter sample after the secondary component screening. According to the invention, fine source analysis of particulate matters is realized.

Description

technical field [0001] The invention belongs to the technical field of particle source analysis, and in particular relates to a refined particle source analysis method. Background technique [0002] Most of the existing atmospheric particulate matter source apportionment methods only use inorganic elements, ions and elemental carbon components for particulate matter source apportionment. difficulty. [0003] There are many types of organic compounds involved in existing studies, but the identification and screening of organic compounds have not been further identified and screened when using them for source apportionment. When a large number of organic compounds and a small amount of If a large amount of organic matter is directly included in the model, the uncertainty of the model will be increased, resulting in inaccurate source apportionment results. Contents of the invention [0004] In order to solve the above problems, the present invention provides a method for an...

Claims

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Application Information

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IPC IPC(8): G01N15/00
CPCG01N15/00
Inventor 薛倩倩田瑛泽冯银厂
Owner NANKAI UNIV
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