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Three-dimensional measurement system, method and device, medium and electronic equipment

A three-dimensional measurement and three-dimensional coordinate technology, applied in the field of measurement, can solve the problems of increasing the preparation work for measurement, the influence of measurement accuracy, and the unfavorable system integration of off-axis projection.

Active Publication Date: 2021-06-18
上海盛晃光学技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Spraying chemical materials can change the reflective properties of the surface of the measured object, but it increases the preparation work for measurement, and the measurement accuracy will also be affected by the sprayed layer, and may destroy the surface properties of the measured object, so it is not universally applicable On-line 3D detection
[0008] In some technical solutions for measuring the composite reflective surface of diffuse reflection and specular reflection, there are problems that off-axis projection is not conducive to system integration, the frequency of projected images is low, additional polarizers are added, and the angle of polarizers needs to be adjusted continuously, so that all Can not meet the three-dimensional measurement requirements of composite reflective surfaces

Method used

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  • Three-dimensional measurement system, method and device, medium and electronic equipment
  • Three-dimensional measurement system, method and device, medium and electronic equipment
  • Three-dimensional measurement system, method and device, medium and electronic equipment

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Embodiment 1

[0050] In the embodiment of the present invention, the first image data and the second image data are obtained by the same image acquisition module collecting the reflected light of the light projected by different structured light projection light sources to the same incident point.

[0051] like Figure 4 As shown, the three-dimensional measurement system provided by the embodiment of the present invention includes: a first structured light projection light source 431; a second structured light projection light source 432, which is arranged on the first normal line perpendicular to the surface of the measured object passing through the first incident point O1 Above: the first image acquisition module 441, configured to acquire the first structured light projection light source 431 and the reflected light from the light projected by the first structured light projection light source 431 to the first incident point O1, wherein the first image acquisition module 441 and the fir...

Embodiment 2

[0062] In the embodiment of the present invention, the first image data and the second image data are obtained by different image acquisition modules collecting the reflected light of the light projected by the same structured light projection light source to the same incident point.

[0063] like Figure 5 As shown, the three-dimensional measurement system of the embodiment of the present invention includes: a third structured light projection light source 531, used to project light onto the second incident point on the surface of the measured object; a second image acquisition module 541, used to acquire the third structure The light projected by the light projection light source to the second incident point is reflected by a specular surface, wherein the second image acquisition module and the third structured light projection light source are symmetrically distributed on both sides of the second normal line 520 to ensure that the third structured light The light projected ...

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Abstract

The embodiment of the invention provides three-dimensional measurement system, method and device, medium and electronic equipment. The three-dimensional measurement method comprises the following steps: acquiring first image data of light which is formed by light projected to the surface of a measured object through mirror reflection on the surface of the measured object; acquiring second image data of light rays formed by diffuse reflection of the light rays projected to the surface of the measured object on the surface of the measured object; and reconstructing a three-dimensional image of the surface of the measured object according to the three-dimensional coordinate information of the first image data and the second image data. According to the technical scheme, the precision of three-dimensional measurement of the composite reflection surface with diffuse reflection and specular reflection can be improved.

Description

technical field [0001] The present invention relates to the technical field of measurement, in particular to a three-dimensional measurement system, method, device, computer-readable storage medium and electronic equipment. Background technique [0002] Optical 3D measurement technology is a non-contact 3D reconstruction technology. It uses one or more light sources to project specific single or multiple patterns onto the measured object, and at the same time, one or more image sensors are used to shoot the measured object, and by analyzing and calculating the image data collected by the image sensor, using Based on the principle of triangulation, the image data containing depth information is finally obtained. Optical three-dimensional measurement technology is widely used in measurement fields such as material surface measurement due to its advantages of non-contact and fast measurement. [0003] The traditional structured light 3D measurement system architecture can bet...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
CPCG01B11/2433
Inventor 顾锦玮
Owner 上海盛晃光学技术有限公司
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