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Industrial image defect detection method and system based on multi-task twin network

A defect detection and twin network technology, which is applied in biological neural network models, image enhancement, image analysis, etc., can solve the problems of insufficient depth of twin network defect detection technology and insufficient model generalization, etc., to improve the ability of binary classification detection, The effect of improving generalization ability and good detection performance

Pending Publication Date: 2021-07-23
聚时科技(上海)有限公司
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Problems solved by technology

[0007] The purpose of the present invention is to provide an industrial image defect detection method and system based on a multi-task twin network, which has solved the defects of insufficient model generalization and insufficient depth of twin network defect detection technology in the above-mentioned prior art

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  • Industrial image defect detection method and system based on multi-task twin network
  • Industrial image defect detection method and system based on multi-task twin network
  • Industrial image defect detection method and system based on multi-task twin network

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Embodiment Construction

[0056] In order to make the object, technical solution and beneficial technical effects of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific implementations described in this specification are only for explaining the present invention, not for limiting the present invention.

[0057] Such as Figure 2-3 As shown, the present invention provides an industrial image defect detection system based on a multi-task twin network. The input data is composed of an image to be detected and a template image input. The detection system includes:

[0058] The backbone network module is used to complete the image data processing using the Siamese network, and represent the image data into multi-scale features;

[0059] The FPN feature extraction module is used to extract FPN features based on multi-scale features;

[0060] The segmen...

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Abstract

The invention relates to the technical field of image processing, and particularly discloses an industrial image defect detection method based on a multi-task twin network. According to the method, a to-be-detected image and a corresponding template image are jointly used as network input, related features of differences between the to-be-detected image and the corresponding template image are calculated, a segmentation network structure is used for carrying out multi-task auxiliary training, a backbone network can clearly and effectively distinguish background information in the FPN feature extraction process, and then FPN features are used for carrying out detection network training, thereby completing a defect dichotomy detection task. According to the invention, a twin network structure is adopted to provide effective guarantee for the generalization ability of the model, the multi-task segmentation network assists in detection network training, so network training is easier, performance is better, and support is provided for dichotomy detection tasks.

Description

technical field [0001] The invention relates to the technical field of image detection, in particular to an industrial image defect detection method and system based on a multi-task twin network. Background technique [0002] With the rapid development of computer vision technology and the wide application of artificial intelligence technology, machine vision technology is more and more used in industrial scenes, and it is widely used in all aspects of production. Defect detection computer vision is one of the scenes where the demand for computer vision has increased sharply in the industrial field in recent years. This task is mainly reflected in the fact that computer vision can quickly and automatically detect product appearance images through data collected by image sensors, and return whether the product has defects and Defect related information. In the defect detection process, the accuracy index of product classification is very important, which directly affects the...

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Application Information

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IPC IPC(8): G06T7/00G06T7/11G06T7/194G06K9/38G06K9/62G06N3/04G06N3/08
CPCG06T7/0004G06T7/11G06T7/194G06N3/08G06T2207/10004G06T2207/20081G06T2207/20084G06T2207/30108G06V10/28G06N3/048G06N3/045G06F18/241
Inventor 张逸为余燕清
Owner 聚时科技(上海)有限公司
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