High-low voltage engineering electrical element test device and test method thereof

An electrical component, high and low voltage technology, applied in the field of high and low voltage engineering electrical component testing equipment, can solve the problems of poor adaptability and inability to simulate the use environment of electrical components, and achieve the effect of strong adaptability

Active Publication Date: 2021-11-23
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In order to solve the above-mentioned high and low voltage engineering electrical component test device can only adapt to the detection of electrical components of a single specification, and the detection of electrical components of different specifications has poor adaptability. At the same time, the high and low voltage engineering electrical component test device can only perform detection and cannot simulate electrical Component use environment, especially the problem of jitter environment

Method used

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  • High-low voltage engineering electrical element test device and test method thereof
  • High-low voltage engineering electrical element test device and test method thereof
  • High-low voltage engineering electrical element test device and test method thereof

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Embodiment

[0049] see figure 1 , 2 , 3, 4, 5 and 6, a high and low voltage engineering electrical component testing device includes a detection box 1; the detection box 1 is symmetrically fixedly connected with a door panel 5, the door panel 5 is connected with a controller 2, and the detection box 1 The left end of the inner bottom of the inner bottom is connected with an X-axis moving structure 3 for moving electrical components. The X-axis moving structure 3 includes a U-shaped mounting seat 31, a first linear drive structure 32, a first limiting chute 33, and a first limiting guide rail. 34 and side plate 35, the first linear drive structure 32 and the first limit guide rail 34 are all fixedly installed on the inner bottom of the detection box 1, and the bottom of the U-shaped mounting seat 31 is provided with the first limit guide rail 34. The first limit chute 33, the side wall of the U-shaped mounting seat 31 is fixedly installed with a side plate 35, and the output shaft of the ...

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Abstract

The invention provides a high and low voltage engineering electrical element test device and a test method thereof. According to the invention, the device comprises a detection box body; door plates are symmetrically and fixedly connected with the detection box body , the door plates are connected with a controller, the left end of the inner bottom of the detection box body is connected with an X-axis moving structure used for moving the electrical element, the X-axis moving structure is connected with a shaking structure used for shaking the electrical element, and the top of the shaking structure is connected with a clamping structure used for clamping the electrical element; and the control method comprises the following specific steps that 1, the electrical element is inserted into the clamping structure, and then the electrical element is fixed by the clamping structure; 2, the X-axis moving structure drives the electrical element to move, meanwhile, the Y-axis moving structure drives the scanning probe to move, and the scanning probe scans the electrical element. The test device has the beneficial effects that the test device is suitable for fixing electrical elements of different sizes and detecting the electrical elements of different specifications, and is high in adaptability.

Description

technical field [0001] The invention relates to the technical field of electrical experimental equipment, in particular to a high and low voltage engineering electrical component testing device and a testing method thereof. Background technique [0002] Electrical components generally refer to electronic components, which are basic elements in electronic circuits, usually individual packages, and have two or more leads or metal contacts. Electronic components must be connected to each other to form an electronic circuit with specific functions. One of the common ways to connect electronic components is to solder them to a printed circuit board. . Among them, electrical components are widely used in high and low voltage engineering, and electrical components need to be tested before they are put into use in high and low voltage engineering. [0003] At present, people use electrical component testing devices to test electrical components. However, the existing high-voltage ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/04
CPCG01R31/00G01R1/0425
Inventor 仲旭刘道远赵式博姜店丰任馨月于程陈楷澳
Owner SHANDONG UNIV
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