A semiconductor discrete device testing device
A technology of discrete devices and testing devices, which is applied in the direction of single semiconductor device testing, measuring devices, measuring device casings, etc., can solve the problems of low use efficiency and poor test effect, improve the convenience of use, prevent doping, and improve detection effect of effect
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[0036] The circular plate 4 is arranged in the inner cavity of the box body 3, and a diode 6 is arranged in each arc-shaped groove 5. Reciprocating mechanism 7 installation
[0046] The feeding mechanism 26 includes a feeding pipe 261. The left side of the feeding pipe 261 is provided with two material guide plates 262. The feeding pipe 261 side
[0054] S6: If the diode 6 is energized normally, the detection light 27 is on, and if the diode 6 detects a fault, the detection light 27 is off.
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