A semiconductor discrete device testing device
A technology of discrete devices and testing devices, which is applied in the direction of single semiconductor device testing, measuring devices, measuring device casings, etc., can solve the problems of low use efficiency and poor test effect, improve the convenience of use, prevent doping, and improve detection effect of effect
Active Publication Date: 2022-05-31
成都思科瑞微电子股份有限公司
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Problems solved by technology
[0004] The technical problem solved by the present invention is to overcome the defects of poor test effect and low use efficiency in the prior art, and provide a semiconductor discrete device test device
Method used
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Embodiment Construction
[0036] The circular plate 4 is arranged in the inner cavity of the box body 3, and a diode 6 is arranged in each arc-shaped groove 5. Reciprocating mechanism 7 installation
[0046] The feeding mechanism 26 includes a feeding pipe 261. The left side of the feeding pipe 261 is provided with two material guide plates 262. The feeding pipe 261 side
[0054] S6: If the diode 6 is energized normally, the detection light 27 is on, and if the diode 6 detects a fault, the detection light 27 is off.
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The invention discloses a semiconductor discrete device testing device, which comprises a bottom plate, a protective shell is fixedly connected to the top surface of the bottom plate, a box body is fixedly connected to the top surface of the protective shell, and the box body is arranged in a circular shape. The inner cavity is provided with a circular plate, and several arc-shaped slots are opened on the side wall of the circular plate, and diodes are arranged in the arc-shaped slots, and a reciprocating mechanism is provided on the side wall of the box body, and the reciprocating mechanism is close to the circle. One side of the plate is provided with a detection mechanism, the top surface of the circular plate is fixedly connected with several magnetic blocks, the bottom surface of the circular plate is fixedly connected with a vertical shaft, and the bottom end of the vertical shaft penetrates the box body and is fixedly connected with a ratchet disc. The vertical shaft is movably connected with the box body, and a first sheave is fixedly connected to the side wall of the vertical shaft. The present invention can intermittently feed the diode through the mutual cooperation between the box body, the circular plate and the feeding mechanism. Avoiding clogging and other situations during feeding can effectively improve its convenience in use.
Description
A semiconductor discrete device testing device technical field The present invention relates to semiconductor discrete device testing technical field, be specifically a kind of semiconductor discrete device testing device set. Background technique Semiconductor discrete devices generally refer to semiconductor crystal diodes, semiconductor triodes for short diodes, triodes and semi-conductors. Conductor special devices, after the processing and production of semiconductor discrete devices are completed, they need to be tested to detect the performance of each product. Use performance to ensure production quality, in which power-on detection is an important step test, which directly affects the quality of the product and the quality of the product. period usage. In the prior art, in the process of using the power-on detection device for the diode of the semiconductor discrete device, most of them do not It can be adjusted according to the pin position of the diode...
Claims
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IPC IPC(8): G01R31/26G01R1/02G01R1/04
CPCG01R31/2601G01R1/02G01R1/04G01R1/0408Y02E10/50
Inventor 杜秋平李亚飞李盼马开鹏
Owner 成都思科瑞微电子股份有限公司