Detector signal acquisition system

Abstract

The invention discloses a detector signal acquisition system, and the system comprises a vibration table which is used for installing a to-be-detected detector and providing a vibration environment for the to-be-detected detector; an amplifying circuit, connected with the vibration table and used for acquiring and amplifying a noise signal of the detector to be detected; an acceleration sensor, mounted on the table surface of the vibration table and used for acquiring a vibration signal of the to-be-detected detector in a vibration state; a control system, configured to receive the noise signal and the vibration signal and integrate the noise signal and the vibration signal to a software interface so as to realize dynamic monitoring of the detector to be detected; and a display, configured to present the dynamic monitoring process of the detector to be detected. Signals collected by the amplifying circuit and the acceleration sensor are received at the same time, so that manual noise monitoring and recording are not needed, and meanwhile automatic vibration noise collection of infrared detectors of different specifications can be supported.

Description

technical field [0001] The invention relates to the field of detector vibration and noise testing, in particular to a detector signal acquisition system. Background technique [0002] Infrared detectors will inevitably be affected by the mechanical vibration of the system in the operating environment, resulting in noise pulses, causing the noise voltage of the detector to rise suddenly under static (steady state), sometimes reaching dozens of times the static noise voltage. Interference is caused to the response signal pulse, which greatly reduces the tracking ability and detection distance of the detector. The vibration table is used to simulate the actual use environment, so the vibration and noise test is an important part of the test process. Only by accurately testing the vibration and noise can we judge whether the detector is qualified, so as to avoid unqualified infrared devices from reaching the user, which will affect the quality of the detector. Product image. ...

AI Technical Summary

Problems solved by technology

The above is only a unit detector test process, such as a multi-element detector needs to repeat the above process many times to complete the test, because the manual test can only detect one channel at a time

Traditional testing methods are time-consuming and laborious, and manual monitoring records are prone to errors. Faced with the increasing production capacity

Images