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Method and device for enhancing defect positioning based on program dependence

A defect and program technology, applied in the field of defect analysis of program software source code, can solve problems such as time-consuming

Active Publication Date: 2021-12-14
NANJING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Especially when the software scale is large, it takes a lot of time to find the defective code

Method used

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  • Method and device for enhancing defect positioning based on program dependence
  • Method and device for enhancing defect positioning based on program dependence
  • Method and device for enhancing defect positioning based on program dependence

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Embodiment Construction

[0085] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0086] Such as figure 1 As shown, the method for defect location based on program dependency enhancement of the present invention mainly includes a model training step ST and a defect analysis step SA.

[0087] The aforementioned data acquisition step represents the input of the present invention, how to acquire the data, and the style of the acquired data need not be described in detail. The input of the present invention is: training data and data to be evaluated. Wherein, the training data is used in the model training step ST, including the source code for training, the list of defect suspiciousness for training and the list of known defects. The data to be evaluated is used in the defect analysis step SA, including source codes to be evaluated and a list of suspicious degrees of defects to be evaluated.

[0088] Both the source code for training and t...

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PUM

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Abstract

The invention discloses a method and a device for enhancing defect positioning based on program dependence. According to the method, statement data dependency relationships of a source code are analyzed, a statement defect suspicious degree table obtained by analyzing the source code through an existing software tool is combined with the statement data dependency relationships to form an eigenvalue vector composed of N + 1 suspicious degree values, and the eigenvalue vector serves as a sample of each statement of the source code and is input into a support vector machine for machine analysis, so that an optimized defect suspicious degree list is obtained. Therefore, a positioning result is enhanced, and defect positioning is more accurate.

Description

technical field [0001] The invention relates to program code analysis technology, in particular to defect analysis technology of program software source code. Background technique [0002] Software inevitably has bugs. In software product projects, the testing cycle is often much longer than the development cycle, because it takes a lot of labor to repair the defects found during the testing process. When repairing defects, the primary difficulty lies in defect location, that is, finding where the defects appear in the software code. Especially when the software scale is large, it takes a lot of time to find the defective code. [0003] As a result, automated software defect location methods and tools have gradually received attention. In the existing technology, there are mainly two methods for defect location: the first is to traverse the program code through static inspection tools to find out suspicious defects; the second is to use the statement coverage information ...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/366Y02P90/30
Inventor 张天潘敏学罗雯波
Owner NANJING UNIV
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