Supercharge Your Innovation With Domain-Expert AI Agents!

Workpiece position adjusting method, control processing device and adjusting system

An adjustment method and control processing technology, applied in the field of automation, can solve problems such as low accuracy of workpiece position information, uncontrollable movement trajectory, and inability to accurately obtain workpiece position information in real time

Pending Publication Date: 2022-01-07
BEIJING SEMICON EQUIP INST THE 45TH RES INST OF CETC
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] After research, it is found that in the current fully automatic semiconductor processing equipment, because some workpieces have special requirements for automation during the processing process, it is necessary to perform feature recognition on the workpiece during the movement of these workpieces. The specific implementation method is as follows: The workpiece is controlled to move according to the reference movement trajectory, and the detection equipment is set at the fixed position of the reference movement trajectory to identify and detect the workpiece. However, since the movement trajectory of the workpiece is uncontrollable in actual detection, the detection equipment at the fixed position cannot be real-time. Accurately obtain the position information of the workpiece, resulting in low accuracy in detecting the position information of the workpiece

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Workpiece position adjusting method, control processing device and adjusting system
  • Workpiece position adjusting method, control processing device and adjusting system
  • Workpiece position adjusting method, control processing device and adjusting system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] For the present application objects, technical solutions, and advantages of the more comprehensible, the present application embodiment in the drawings embodiments below, the technical solutions in the present application will be clearly and fully described, it should be understood that in the present application the drawings are only played purpose of illustration and description, not intended to limit the scope of the present disclosure. Further, it should be understood that the proportions are not in kind schematic drawings drawn. The present application illustrates the process used to achieve the operation according to some embodiments of the present disclosure. It should be understood that the flowchart of the operation sequence may not be achieved, there is no logical context steps may be reversed simultaneously or sequentially. Moreover, those skilled in the art guided by the teachings herein, can add one or more other operations to the flow chart, you may also remov...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a workpiece position adjusting method, a control processing device and an adjusting system.The adjusting method comprises the steps that feature information of a to-be-detected workpiece is obtained, and a reference moving track of the to-be-detected workpiece is determined based on the feature information of the to-be-detected workpiece; in the moving process of the to-be-detected workpiece, multiple moving images of the to-be-detected workpiece are obtained, the actual moving track of the to-be-detected workpiece is determined based on the multiple moving images, and the multiple moving images are actively obtained by following the movement of the to-be-detected workpiece; and if the actual movement track is not consistent with the reference movement track, the position of the to-be-detected workpiece is adjusted based on the reference movement track. The error between the dynamic track and the actual track of the to-be-detected workpiece is accurately compared in real time, parameters for compensating the motion track are provided, and the function of automatic calibration is achieved.

Description

Technical field [0001] The present application relates to the field of automated technology, and more particularly to a modification method, a control processing apparatus, and an adjustment system for a workpiece position. Background technique [0002] Computer vision is an industrial, inspection, document analysis, medical diagnosis, and military and other fields in various intelligent / autonomous systems in various intelligent / autonomous systems. It is a door to how to use camera / cameras and computers. The data and information of the subjects we need are subject to the subject. The image is that it is used to install the eye (camera / camera) and the brain (algorithm) for identifying, tracking and measurement of the target, so that the computer can perceive the environment. Because the perception can be seen as extracting information from the senses signal, computer vision can also be seen as a science of how to "perceive" in image or multi-dimensional data. In general, c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06T7/13G06T7/73G06K9/62
CPCG06T7/0004G06T7/73G06T7/13G06T2207/10004G06T2207/10024G06T2207/30164G06T2207/30241
Inventor 张博赵永进潘峰王文丽薛书亮袁丽娟
Owner BEIJING SEMICON EQUIP INST THE 45TH RES INST OF CETC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More